Growth of Cu2O thin films with high hole mobility by introducing a low-temperature buffer layer

2009 ◽  
Vol 311 (4) ◽  
pp. 1102-1105 ◽  
Author(s):  
B.S. Li ◽  
K. Akimoto ◽  
A. Shen
2020 ◽  
Vol 116 (19) ◽  
pp. 192105 ◽  
Author(s):  
S. Inagaki ◽  
M. Nakamura ◽  
N. Aizawa ◽  
L. C. Peng ◽  
X. Z. Yu ◽  
...  

Author(s):  
B. Riah ◽  
Julien Camus ◽  
Abdelhak Ayad ◽  
Mohammad Rammal ◽  
Raouia Zernadji ◽  
...  

This paper reports the effect of silicon substrate orientation and aluminum nitride buffer layer deposited by molecular beam epitaxy on the growth of aluminum nitride thin films deposited by DC magnetron sputtering technique at low temperature. The structural analysis has revealed a strong (0001) fiber texture for both substrates Si (100) and (111) and a hetero-epitaxial growth on few nanometers AlN buffer layer grown by MBE on Si (111) substrate. SEM images and XRD characterization have shown an enhancement in AlN crystallinity thanks to AlN (MBE) buffer layer. Raman spectroscopy indicated that the AlN film was relaxed when it deposited on Si (111), in compression on Si (100) and under tension on AlN buffer layer grown by MBE/Si (111) substrates, respectively. The interface between Si (111) and AlN grown by MBE is abrupt and well defined; contrary to the interface between AlN deposited using PVD and AlN grown by MBE. Nevertheless, AlN hetero-epitaxial growth was obtained at low temperature (<250°C).


2018 ◽  
Vol 85 ◽  
pp. 168-176 ◽  
Author(s):  
M.A. Badillo-Ávila ◽  
R. Castanedo-Pérez ◽  
M.A. Villarreal-Andrade ◽  
G. Torres-Delgado

APL Materials ◽  
2019 ◽  
Vol 7 (3) ◽  
pp. 031115 ◽  
Author(s):  
Taewoo Ha ◽  
Inhee Park ◽  
Kyung Ik Sim ◽  
Howon Lee ◽  
Jong-Sung Bae ◽  
...  

2009 ◽  
Vol 113 (45) ◽  
pp. 19482-19487 ◽  
Author(s):  
S. Bijani ◽  
L. Martínez ◽  
M. Gabás ◽  
E. A. Dalchiele ◽  
J.-R. Ramos-Barrado

2019 ◽  
Vol 12 (5) ◽  
pp. 055509 ◽  
Author(s):  
Takumi Ikenoue ◽  
Toshikazu Kawai ◽  
Ryo Wakashima ◽  
Masao Miyake ◽  
Tetsuji Hirato

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