Epitaxial growth of cubic Mg0.45Zn0.55O thin films on SrTiO3 (001) substrate with MgO buffer layer

2013 ◽  
Vol 377 ◽  
pp. 78-81 ◽  
Author(s):  
Dapeng Zhu ◽  
Li Cai ◽  
Shumin He ◽  
Guolei Liu ◽  
Shishen Yan ◽  
...  
2004 ◽  
Vol 264 (1-3) ◽  
pp. 463-467 ◽  
Author(s):  
D. Akai ◽  
K. Hirabayashi ◽  
M. Yokawa ◽  
K. Sawada ◽  
M. Ishida

Author(s):  
B. Riah ◽  
Julien Camus ◽  
Abdelhak Ayad ◽  
Mohammad Rammal ◽  
Raouia Zernadji ◽  
...  

This paper reports the effect of silicon substrate orientation and aluminum nitride buffer layer deposited by molecular beam epitaxy on the growth of aluminum nitride thin films deposited by DC magnetron sputtering technique at low temperature. The structural analysis has revealed a strong (0001) fiber texture for both substrates Si (100) and (111) and a hetero-epitaxial growth on few nanometers AlN buffer layer grown by MBE on Si (111) substrate. SEM images and XRD characterization have shown an enhancement in AlN crystallinity thanks to AlN (MBE) buffer layer. Raman spectroscopy indicated that the AlN film was relaxed when it deposited on Si (111), in compression on Si (100) and under tension on AlN buffer layer grown by MBE/Si (111) substrates, respectively. The interface between Si (111) and AlN grown by MBE is abrupt and well defined; contrary to the interface between AlN deposited using PVD and AlN grown by MBE. Nevertheless, AlN hetero-epitaxial growth was obtained at low temperature (<250°C).


2019 ◽  
Vol 494 ◽  
pp. 644-650 ◽  
Author(s):  
Wen-Cheng Ke ◽  
Zhong-Yi Liang ◽  
Solomun Teklahymanot Tesfay ◽  
Chih-Yung Chiang ◽  
Cheng-Yi Yang ◽  
...  

2002 ◽  
Vol 80 (13) ◽  
pp. 2323-2325 ◽  
Author(s):  
H. Wang ◽  
Ashutosh Tiwari ◽  
A. Kvit ◽  
X. Zhang ◽  
J. Narayan

2008 ◽  
Vol 516 (17) ◽  
pp. 5842-5846 ◽  
Author(s):  
Takayoshi Katase ◽  
Kenji Nomura ◽  
Hiromichi Ohta ◽  
Hiroshi Yanagi ◽  
Toshio Kamiya ◽  
...  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Pei-Chen Wu ◽  
Chun-Liang Yang ◽  
Yuanmin Du ◽  
Chih-Huang Lai

1998 ◽  
Vol 211 (1) ◽  
pp. 141-151 ◽  
Author(s):  
Dong Soo Paik ◽  
A. V. Prasada Rao ◽  
S. Komarneni

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