Investigation of the photodecomposition process of thin layers of arachidic acid on titanium dioxide coatings modified by silver nanoparticles observed in situ by atomic force microscopy

2017 ◽  
Vol 335 ◽  
pp. 239-247 ◽  
Author(s):  
Karolina Bałuszyńska ◽  
Aneta Kisielewska ◽  
Kaja Spilarewicz-Stanek ◽  
Joanna Ginter ◽  
Ireneusz Piwoński
Keyword(s):  
Atomic Force Microscopy ◽  
Silver Nanoparticles ◽  
Titanium Dioxide ◽  
Arachidic Acid ◽  
Thin Layers ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy

2020 ◽  
pp. 94-98
Author(s):  
N. A. Davletkildeev ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Oxidative Polymerization ◽  
Pyrolytic Graphite ◽  
Thin Layers ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics

Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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