`Corrosion of steel in a CO2-containing solution droplet generated in wet gas pipelines studied by scanning Kelvin probe

Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Quantitative calibration of the relationship between Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration

Electrochimica Acta ◽

10.1016/j.electacta.2020.137422 ◽

2021 ◽

Vol 366 ◽

pp. 137422

Author(s):

Zhaoxiang Ma ◽

Xilin Xiong ◽

Lin Chen ◽

Yanjing Su

Keyword(s):

Hydrogen Concentration ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Volta Potential ◽

The Relationship

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Scanning Kelvin probe measurements on As-doped CdTe solar cells

Semiconductor Science and Technology ◽

10.1088/0268-1242/28/10/105024 ◽

2013 ◽

Vol 28 (10) ◽

pp. 105024 ◽

Cited By ~ 8

Author(s):

W S M Brooks ◽

S J C Irvine ◽

D M Taylor

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Cdte Solar Cells ◽

Scanning Kelvin Probe ◽

Probe Measurements

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Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging

The Journal of Physical Chemistry C ◽

10.1021/jp1056607 ◽

2010 ◽

Vol 114 (48) ◽

pp. 20672-20677 ◽

Cited By ~ 42

Author(s):

Obadiah G. Reid ◽

Glennis E. Rayermann ◽

David C. Coffey ◽

David S. Ginger

Keyword(s):

Solar Cells ◽

Conjugated Polymer ◽

Electrostatic Force ◽

Polymer Solar Cells ◽

Electrostatic Force Microscopy ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Trap Formation ◽

Scanning Kelvin Probe

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In situ infrared spectroscopic and scanning Kelvin probe measurements of water and ion transport at polymer/metal interfaces

Electrochimica Acta ◽

10.1016/j.electacta.2005.09.024 ◽

2006 ◽

Vol 51 (16) ◽

pp. 3303-3315 ◽

Cited By ~ 54

Author(s):

K. Wapner ◽

M. Stratmann ◽

G. Grundmeier

Keyword(s):

Ion Transport ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Infrared Spectroscopic ◽

Polymer Metal ◽

Metal Interfaces ◽

Water And Ion Transport ◽

Probe Measurements

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Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheet

Electrochimica Acta ◽

10.1016/j.electacta.2012.10.051 ◽

2013 ◽

Vol 88 ◽

pp. 330-339 ◽

Cited By ~ 26

Author(s):

F. Norouzi Afshar ◽

J.H.W. de Wit ◽

H. Terryn ◽

J.M.C. Mol

Keyword(s):

Al Alloys ◽

Kelvin Probe Force Microscopy ◽

Electrochemical Characteristics ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Photoreduction Altered Work Function of Au–TiO2 Nanoparticles Measured by Scanning Kelvin Probe Microscopy

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2013.7932 ◽

2013 ◽

Vol 13 (12) ◽

pp. 8217-8223 ◽

Cited By ~ 12

Author(s):

Arun S. Patel ◽

Avesh Kumar ◽

T. Mohanty

Keyword(s):

Work Function ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Scanning Kelvin Probe

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Hydrogen diffusion and trapping in a low copper 7xxx aluminium alloy investigated by Scanning Kelvin Probe Force Microscopy

Materials Science and Engineering A ◽

10.1016/j.msea.2017.08.119 ◽

2017 ◽

Vol 706 ◽

pp. 126-135 ◽

Cited By ~ 16

Author(s):

Loïc Oger ◽

Manon Chloé Lafouresse ◽

Grégory Odemer ◽

Lionel Peguet ◽

Christine Blanc

Keyword(s):

Aluminium Alloy ◽

Hydrogen Diffusion ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Influence of film structure and light on charge trapping and dissipation dynamics in spun-cast organic thin-film transistors measured by scanning Kelvin probe microscopy

Applied Physics Letters ◽

10.1063/1.4720063 ◽

2012 ◽

Vol 100 (26) ◽

pp. 263305 ◽

Cited By ~ 3

Author(s):

L. C. Teague ◽

M. A. Loth ◽

J. E. Anthony

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Charge Trapping ◽

Film Structure ◽

Organic Thin Film Transistors ◽

Organic Thin Film ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Scanning Kelvin Probe

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FLOW ASSURANCE IN KUMUJE WET-GAS PIPELINE: ANALYSIS OF PIGGING SOLUTION TO LIQUID ACCUMULATION

International Journal of Scientific and Engineering Research ◽

10.14299/ijser.2018.09.09 ◽

2018 ◽

Vol 9 (9) ◽

pp. 380-386

Author(s):

Sarah Akintola ◽

Emmanuel Folorunsho ◽

Oluwakunle Ogunsakin

Keyword(s):

Pressure Loss ◽

Gas Pipeline ◽

Gas Condensate ◽

Flow Assurance ◽

Gas Pipelines ◽

Wet Gas ◽

Highly Sensitive ◽

Temperature And Pressure ◽

Pipeline Corrosion ◽

Assurance Problem

Liquid condensation in gas-condensate pipelines in a pronounced phenomenon in long transporting lines because of the composition of the gas which is highly sensitive to variations in temperature and pressure along the length of the pipeline. Hence, there is a resultant liquid accumulation in onshore wet-gas pipelines because of the pipeline profile. This accumulation which is a flow assurance problem can result to pressure loss, slugging and accelerated pipeline corrosion if not properly handled.

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