Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model

Author(s):  
Ivan Ohlídal ◽  
Jiří Vohánka ◽  
Vilma Buršíková ◽  
Jaroslav Ženíšek ◽  
Petr Vašina ◽  
...  
2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman

2015 ◽  
Author(s):  
Miloslav Ohlídal ◽  
Ivan Ohlidal ◽  
David Nečas ◽  
Jiří Vodák ◽  
Daniel Franta ◽  
...  

2016 ◽  
Vol 851 ◽  
pp. 199-204 ◽  
Author(s):  
Veronika Schmiedova ◽  
Jan Pospisil ◽  
Oldrich Zmeskal ◽  
Viliam Vretenar

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.


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