Erratum to “Effect of substrate temperature on the thermal stability of Cu/Zr–N/Si contact system” [Materials Lett. 62 (2007) 2289–2292]

2009 ◽  
Vol 63 (11) ◽  
pp. 959
Author(s):  
Ying Wang ◽  
Chunhui Zhao ◽  
Fei Cao ◽  
Lei Shao
2008 ◽  
Vol 62 (3) ◽  
pp. 418-421 ◽  
Author(s):  
Ying Wang ◽  
Chunhui Zhao ◽  
Fei Cao ◽  
Lei Shao

2008 ◽  
Vol 62 (15) ◽  
pp. 2289-2292 ◽  
Author(s):  
Ying Wang ◽  
Chunhui Zhao ◽  
Fei Cao ◽  
Lei Shao

1995 ◽  
Vol 403 ◽  
Author(s):  
A. Piotrowska ◽  
E. Kańifiska ◽  
M. Guziewicz ◽  
E. Mizera ◽  
E. Dynowska ◽  
...  

AbstractAnnealing behavior of Au, AuZn, and AuSb metallization on GaSb have been investigated by the combined use of RBS, XRD, TEM, and I-V characterization. The results give evidence that the thermally activated contact reaction strongly depends on the particular elements incorporated in the Au layer. Pure Au reacts with GaSb at 100°C. The addition of Zn to Au metallization increases the thermal stability of the metallization/semiconductor system to 200°C. Antimony, forming with gold the AuSb2 phase in metallization, provides the most stable ohmic contact system.


1999 ◽  
Vol 595 ◽  
Author(s):  
E. Kaminska ◽  
A. Piotrowska ◽  
A. Barcz ◽  
J. Jasinski ◽  
M. Zielinski ◽  
...  

AbstractWe have shown that Zr-based metallization can effectively remove hydrogen from the p-type GaN subsurface, which eventually leads to the formation of an ohmic contact. As the release of hydrogen starts at ∼900°C, the thermal stability of the contact system is of particular importance. The remarkable thermal behavior of the ZrN/ZrB2 metallization is associated to the microstructure of each individual Zr-based compound, as well as to the interfacial crystalline accommodation.


1999 ◽  
Vol 38 (Part 1, No. 3A) ◽  
pp. 1343-1351 ◽  
Author(s):  
Kow-Ming Chang ◽  
I-Chung Deng ◽  
Ta-Hsun Yeh ◽  
Kuen-Der Lain ◽  
Chao-Ming Fu

2000 ◽  
Vol 5 (S1) ◽  
pp. 570-576
Author(s):  
E. Kaminska ◽  
A. Piotrowska ◽  
A. Barcz ◽  
J. Jasinski ◽  
M. Zielinski ◽  
...  

We have shown that Zr-based metallization can effectively remove hydrogen from the p-type GaN subsurface, which eventually leads to the formation of an ohmic contact. As the release of hydrogen starts at ∼900°C, the thermal stability of the contact system is of particular importance. The remarkable thermal behavior of the ZrN/ZrB2 metallization is associated to the microstructure of each individual Zr-based compound, as well as to the interfacial crystalline accommodation.


1994 ◽  
Vol 77 (1) ◽  
pp. 108-116
Author(s):  
Takahiro Sasaki ◽  
Shinya Kagomi ◽  
Katsutaka Sasaki ◽  
Atsushi Noya ◽  
Ken'Ichi Yoshimoto

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