Microstructures and microwave dielectric properties of Mg+1Ti O3+1 ceramics with ultralow dielectric loss

2016 ◽  
Vol 185 ◽  
pp. 432-435 ◽  
Author(s):  
Xianpei Huang ◽  
Fei Liu ◽  
Changlai Yuan ◽  
Xinyu Liu ◽  
Jingjing Qu ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Dielectric Loss ◽  
Microwave Dielectric Properties ◽  
Microwave Dielectric

Microstructure and Microwave Dielectric Properties of BaTi4O9 Ceramics Derived from a Sol-Gel Precursor

2011 ◽  
Vol 326 ◽  
pp. 127-130
Author(s):  
Xian Li Huang ◽  
Fu Ping Wang ◽  
Ying Song
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Dielectric Loss ◽  
Sol Gel ◽  
Microwave Dielectric Properties ◽  
Sintering Process ◽  
Temperature Coefficients ◽  
Microwave Dielectric ◽  
Ceramic Samples ◽  
Quality Factor Q

In the present work, the microstructure and microwave dielectric properties of BaTi4O9 ceramics derived from a sol-gel precursor were presented. Density measuring results demonstrated that the largest densities of ceramic sample about 96.7% could be reached by virtue of a cool iso-static press and a sintering process at at 1300 °C for 6 hours. The dielectric constant (εr), quality factor (Q×f) and the temperature coefficients (τf) of the BaTi4O9 ceramic samples were 36.65, 28000 GHz, +20.2 ppm/°C, respectively. XRD, SEM and XPS were used to characterize the microstructure of the ceramics samples. Substantial Ti3+ was proposed to be the cause of dielectric loss.

Effect of Thermal Stress on the Microwave Dielectric Properties of (300-X) nm MgTiO3 /(X) nm CaTiO3 Thin Films

2006 ◽  
Vol 45 ◽  
pp. 2332-2336
Author(s):  
Ki Hyun Yoon ◽  
Ji Won Choi
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Thermal Expansion ◽  
Thermal Stress ◽  
Dielectric Properties ◽  
Dielectric Loss ◽  
Microwave Dielectric Properties ◽  
Mixing Rule ◽  
Microwave Dielectric ◽  
Dielectric Layers

The microwave dielectric properties of (300-X) nm MgTiO3/(X) nm CaTiO3 thin films have been investigated with correlation between the interface and stress induced by dielectric layers with heattreatment. As the thickness (X) of CaTiO3 film increased, the dielectric constant increased and the temperature coefficient of the dielectric constant changed from the positive to the negative values by the dielectric mixing rule. The dielectric loss of (300-X) nm MgTiO3/(X) nm CaTiO3 thin films increased with an increase of the thickness (X) of CaTiO3 film because of higher thermal stress induced by the higher thermal expansion coefficient of CaTiO3 than that of MgTiO3.

Effects of ZnO Addition and Sintering Temperature on Dielectric Properties of MgTiO3 Ceramic

2014 ◽  
Vol 616 ◽  
pp. 145-152 ◽  
Author(s):  
Xiao Li Ji ◽  
Fang Yi ◽  
Song Zhang ◽  
Cheng C. Zhai ◽  
Peng Fei Hu
Keyword(s):  
Dielectric Properties ◽  
Dielectric Loss ◽  
Quality Factor ◽  
Glass Phase ◽  
Sintering Temperature ◽  
Microwave Dielectric Properties ◽  
Microwave Dielectric ◽  
Wide Range ◽  
Porosity Defects

The effects of ZnO addition and sintering temperature on dielectric properties of MgTiO3 ceramics were investigated. The results showed that addition ZnO not only reduce the sintering temperature but also improve the density and dielectric properties of MgTiO3 ceramics. (Mg1-xZnx)TiO3 (MZT) ceramics shows microwave dielectric properties in a wide range of sintering temperature when x = 0.1, 0.2, 0.3. At x ≥ 0.4, the density of ceramics decreased and porosity, defects and glass phase increased with increased doping of ZnO, resulting in the increase of dielectric loss of MZT and reduce of quality factor.

Sintering, Microstructure and Dielectric Properties of Ca-Al-B-Si-O Glass/Al2O3 Composites with Various SiO2 Content

2011 ◽  
Vol 130-134 ◽  
pp. 1516-1519
Author(s):  
Ming Liu ◽  
Hong Qing Zhou ◽  
Hai Kui Zhu ◽  
Min Liu ◽  
Jian Xin Zhao
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Dielectric Loss ◽  
Silicon Dioxide ◽  
Bulk Density ◽  
Microwave Dielectric Properties ◽  
Microwave Dielectric ◽  
Tan Δ ◽  
Silicon Dioxide Content

The effects of silicon dioxide addition on the sintering, microstructure and microwave dielectric properties of Ca-Al-B-Si-O glass/Al2O3 composites were investigated. Results show that: Increasing the silicon dioxide content in the glass leads to the corresponding rise of bulk density, dielectric constant of the LTCC materials and the decrease of its dielectric loss and porosity. A bulk density of 2.92 g·cm-3, a porosity of 0.2%, aεr value of 7.11 and a tan δ value of 0.00096(measured at 10 MHz) are obtained for 68 wt% silicon dioxide of the samples sintered at 875°C for 30 min.

Microwave dielectric properties of CaV2O6 ceramics with low dielectric loss

2015 ◽  
Vol 26 (10) ◽  
pp. 7719-7722 ◽  
Author(s):  
Guo-Guang Yao ◽  
Cui-Jin Pei ◽  
Jian-Gang Xu ◽  
Peng Liu ◽  
Jian-Ping Zhou ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Dielectric Loss ◽  
Microwave Dielectric Properties ◽  
Low Dielectric ◽  
Microwave Dielectric
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