Theoretical Analysis of XRD Data by X-Ray Peak Profile Analysis for Estimation of lattice Strain and crystallite Size and study of the Effect of Growth Temperature in CdS Nanoparticles

2021 ◽  
Vol 47 ◽  
pp. 6384-6388
Author(s):  
Rekha Garg Solanki ◽  
P. Rajaram
Keyword(s):  
Theoretical Analysis ◽  
Crystallite Size ◽  
Growth Temperature ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Cds Nanoparticles ◽  
X Ray

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

Crystallite size and lattice strain of lithiated spinel material for rechargeable battery by X-ray diffraction peak-broadening analysis

2019 ◽  
Vol 43 (5) ◽  
pp. 1903-1911 ◽  
Author(s):  
Ahmed A. Al-Tabbakh ◽  
Nilgun Karatepe ◽  
Aseel B. Al-Zubaidi ◽  
Aida Benchaabane ◽  
Natheer B. Mahmood
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Diffraction Peak ◽  
Rechargeable Battery ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

AXES1.9: new tools for estimation of crystallite size and shape by Williamson–Hall analysis

1999 ◽  
Vol 32 (2) ◽  
pp. 345-350 ◽  
Author(s):  
Hugo Mändar ◽  
Jürgen Felsche ◽  
Valdek Mikli ◽  
Toivo Vajakas
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Linear Interpolation ◽  
Shape Functions ◽  
Diffraction Vector ◽  
X Ray ◽  
Peak Fitting ◽  
Hall Plot ◽  
The World ◽  
Shape Analyses

Dialogues for the estimation of crystallite size, shape and lattice strain are designed and included in an X-ray powder diffraction (XRPD) program, namedAXES. They implement peak fitting and Voigt analysis followed by a Williamson–Hall plot (WHP). Eight different peak-shape functions can be used for individual peak fitting. Volume-weighted crystallite size and effective lattice deformation are calculated from linear interpolation of the WHP. Actual dimensions (diameters of spheres, diameters and heights of cylinders) are calculated, assuming spherical or cylindrical shapes of the crystallites. Results of size–shape analyses can be visualized in the form of a WHP and as an arrow diagram (HPGL format), which shows distribution of observed apparent and true sizes of crystallites with a diffraction vector. The program has been written in Borland Pascal 7.0 for MS-DOS. The executable code is availableviathe World Wide Web.

Dislocation structure and crystallite size in severely deformed copper by X-ray peak profile analysis

2005 ◽  
Vol 400-401 ◽  
pp. 334-338 ◽  
Author(s):  
J. Gubicza ◽  
L. Balogh ◽  
R.J. Hellmig ◽  
Y. Estrin ◽  
T. Ungár
Keyword(s):  
Crystallite Size ◽  
Dislocation Structure ◽  
Profile Analysis ◽  
X Ray

scholarly journals Influence of sintering temperature and pressure on crystallite size and lattice defect structure in nanocrystalline SiC

2007 ◽  
Vol 22 (5) ◽  
pp. 1314-1321 ◽  
Author(s):  
J. Gubicza ◽  
S. Nauyoks ◽  
L. Balogh ◽  
J. Labar ◽  
T.W. Zerda ◽  
...  
Keyword(s):  
Crystallite Size ◽  
Defect Structure ◽  
Sintering Temperature ◽  
Profile Analysis ◽  
Lattice Defect ◽  
Line Profile Analysis ◽  
Crystallite Growth ◽  
X Ray ◽  
Transmission Electron ◽  
Temperature And Pressure

Microstructure of sintered nanocrystalline SiC is studied by x-ray line profile analysis and transmission electron microscopy. The lattice defect structure and the crystallite size are determined as a function of pressure between 2 and 5.5 GPa for different sintering temperatures in the range from 1400 to 1800 °C. At a constant sintering temperature, the increase of pressure promotes crystallite growth. At 1800 °C when the pressure reaches 8 GPa, the increase of the crystallite size is impeded. The grain growth during sintering is accompanied by a decrease in the population of planar faults and an increase in the density of dislocations. A critical crystallite size above which dislocations are more abundant than planar defects is suggested.

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