Crystallite size and lattice strain of lithiated spinel material for rechargeable battery by X-ray diffraction peak-broadening analysis

2019 ◽  
Vol 43 (5) ◽  
pp. 1903-1911 ◽  
Author(s):  
Ahmed A. Al-Tabbakh ◽  
Nilgun Karatepe ◽  
Aseel B. Al-Zubaidi ◽  
Aida Benchaabane ◽  
Natheer B. Mahmood
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Diffraction Peak ◽  
Rechargeable Battery ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

X-ray diffraction peak broadening and lattice strain in LaNi5-based alloys

2000 ◽  
Vol 298 (1-2) ◽  
pp. 138-145 ◽  
Author(s):  
Yumiko Nakamura ◽  
Keisuke Oguro ◽  
Itsuki Uehara ◽  
Etsuo Akiba
Keyword(s):  
Lattice Strain ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

2009 ◽  
Vol 42 (4) ◽  
pp. 673-680 ◽  
Author(s):  
Valeriy A. Luchnikov ◽  
Dimitri A. Ivanov
Keyword(s):  
Basal Plane ◽  
Peak Position ◽  
Diffraction Peak ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Asymmetric Shape ◽  
Diffraction Peaks ◽  
Lamellar Crystals

The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites.

Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements

2004 ◽  
Vol 51 (1) ◽  
pp. 59-63 ◽  
Author(s):  
Sanjay K. Rai ◽  
Anish Kumar ◽  
Vani Shankar ◽  
T. Jayakumar ◽  
K. Bhanu Sankara Rao ◽  
...  
Keyword(s):  
Lattice Parameter ◽  
Diffraction Peak ◽  
Inconel 625 ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Preparation of LaFeO3 particles by sol-gel technology

1998 ◽  
Vol 13 (2) ◽  
pp. 451-456 ◽  
Author(s):  
C. Vázquez-Vázquez ◽  
P. Kögerler ◽  
M. A. López-Quintela ◽  
R. D. Sánchez ◽  
J. Rivas
Keyword(s):  
Particle Size ◽  
Magnetic Properties ◽  
Infrared Spectroscopy ◽  
Sol Gel ◽  
Diffraction Peak ◽  
Gel Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ferromagnetic Component ◽  
Peak Broadening

The study of submicroscopic particles in already known systems has resulted in a renewed interest due to the large differences found in their properties when the particle size is reduced, and because of possible new technological applications. In this work we report the preparation of LaFeO3 particles by the sol-gel route, starting from a solution of the corresponding metallic nitrates and using urea as gelificant agent. Gels were decomposed at 200 °C and calcined 3 h at several temperatures, T, in the range 250–1000 °C. The samples were structurally characterized by x-ray diffraction (XRD) showing that the orthoferrite crystallizes at T as low as 315 °C. From the x-ray diffraction peak broadening, the particle size was determined. The size increases from 60 to 300 nm as the calcination T increases. Infrared spectroscopy was used to characterize gels and calcined samples. From these studies a mechanism for the gel formation is proposed. Study of the magnetic properties of LaFeO3 particles shows the presence of a ferromagnetic component which diminishes as the calcination temperature increases, vanishing at T = 1000 °C.

An empirical Scherrer equation for weakly swelling mixed-layer minerals, especially illite-smectite

Clay Minerals ◽  
1999 ◽  
Vol 34 (4) ◽  
pp. 601-617 ◽  
Author(s):  
M. Jaboyedoff ◽  
B. Kübler ◽  
Ph. Thélin
Keyword(s):  
Mixed Layer ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Scherrer Equation ◽  
Xrd Patterns ◽  
Mixed Layering

AbstractThe Scherrer equation links the measured width of an X-ray diffraction peak (Scherrer width, SW) to the number of stacked cells (N) in the direction normal to the diffracting planes. The formula is only valid for one d-value occurring in the coherently diffracting domain. This equation can be modified for weakly swelling mixed-layer minerals. This assumes that the peak broadening caused by the mixed-layering is proportional to the amount of swelling component (S) and that the effects of size and mixed-layering are additive.If two SW can be measured on XRD patterns from samples treated in two different ways (such as air dried or glycolated), N and S can be determined. This equation is applicable to illite-smectite mixed-layer minerals with high illitic content. The results are most accurate for N>30. The use of Scherrer's equation is discussed.

Effect of Tin Composition on Cu2ZnSnS4 Photovoltaic Absorbers

2012 ◽  
Vol 534 ◽  
pp. 156-159 ◽  
Author(s):  
Dong Hua Fan ◽  
Rong Zhang ◽  
Hui Ren Peng
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Band Gap ◽  
Crystallite Size ◽  
Optical Band Gap ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
X Ray ◽  
Poor Condition ◽  
Czts Thin Films

Cu2ZnSnS4 (CZTS) thin films are prepared by sulfurizing the precursors deposited by vacuum evaporation methods. The samples sulfurized at 500°C for 3h shows the strong (112) diffraction peak at 28.45˚, suggesting the successful synthesis of CZTS thin films. The X-ray diffraction shows that CZTS thin film prepared in Sn-poor condition have the best crystallinity. The Sn-dependent crystallite size was calculated to be 19.53-21.03 nm. In addition, we found that the optical band gap with various Sn contents can be modulated at 1.48-1.85 eV

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