Determination of dielectric constant and loss of high-K thin films in the microwave frequencies

Measurement ◽  
2010 ◽  
Vol 43 (4) ◽  
pp. 556-562 ◽  
Author(s):  
K. Sudheendran ◽  
D. Pamu ◽  
M. Ghanashyam Krishna ◽  
K.C. James Raju
1974 ◽  
Vol 52 (23) ◽  
pp. 2365-2369 ◽  
Author(s):  
Abhai Mansingh ◽  
D. B. McLay ◽  
K. O. Lim

A microwave technique for measuring the complex dielectric permittivity of liquids by using a cylindrical cavity oscillating in the TM010 mode is described. The liquid is placed in a cylindrical teflon cell and the dielectric constant and loss of the liquid are evaluated by measuring accurately the changes in the resonant frequency and Q of the cavity for the composite sample and for the teflon alone. This technique has been used to measure the dielectric constant and loss at 2.4 GHz of some pure liquids and solutions in benzene of ortho and meta isomers of difluoro-, dichloro-, dibromo-, and diiodo-benzene. The measured values for the pure liquids are in good agreement with the literature values. The dielectric relaxation times and dipole moments of the dihalobenzenes in benzene solution evaluated by assuming a simple Debye type dispersion show good agreement with the earlier calculated values derived from Cole–Cole plots based on measurements at several microwave frequencies. This technique, by virtue of the use of a teflon cell and of gold plated end caps, allows the determination of the dielectric properties of corrosive liquids at microwave frequencies and another advantage is that very small liquid samples are required.


Author(s):  
A. Ege Engin ◽  
Abdemanaf Tambawala ◽  
Madhavan Swaminathan ◽  
Swapan Bhattacharya ◽  
Pranabes Pramanik ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (73) ◽  
pp. 69381-69386 ◽  
Author(s):  
S. J. Park ◽  
S. A. N. Yoon ◽  
Y. H. Ahn

In this paper, we demonstrate that terahertz (THz) metamaterials are powerful tools for determination of dielectric constants of polymer films and polar liquids.


2002 ◽  
Vol 748 ◽  
Author(s):  
Apurba Laha ◽  
S. B. Krupanidhi ◽  
S. Saha

ABSTRACTThe dielectric response of BaBi2Nb2O9 (BBN) thin films has been studied as a function of frequency over a wide range of temperatures. Both dielectric constant and loss tangent of BBN thin films showed a ‘power law’ dependence with frequency, which was analyzed using the Jonscher's universal dielectric response model. Theoretical fits were utilized to compare the experimental results and also to estimate the value of temperature dependence parameters such as n(T) and a(T) used in the Jonscher's model. The room temperature dielectric constant (ε') of the BBN thin films was 214 with a loss tangent (tanδ) of 0.04 at a frequency of 100 kHz. The films exhibited the second order dielectric phase transition from ferroelectric to paraelectric state at a temperature of 220 °C. The nature of phase transition was confirmed from the temperature dependence of dielectric constant and sponteneous polarization,respectively. The calculated Currie constant for BBN thin films was 4 × 105°C.


1978 ◽  
Vol 1 (3) ◽  
pp. 134 ◽  
Author(s):  
ET Selig ◽  
TA Okrasinski ◽  
RM Koerner ◽  
AE Lord

Sign in / Sign up

Export Citation Format

Share Document