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Understanding the micro structure of Berea Sandstone by the simultaneous use of micro-computed tomography (micro-CT) and focused ion beam-scanning electron microscopy (FIB-SEM)
Micron
◽
10.1016/j.micron.2010.12.002
◽
2011
◽
Vol 42
(5)
◽
pp. 412-418
◽
Cited By ~ 71
Author(s):
Bijoyendra Bera
◽
Sushanta K. Mitra
◽
Douglas Vick
Keyword(s):
Electron Microscopy
◽
Computed Tomography
◽
Scanning Electron Microscopy
◽
Focused Ion Beam
◽
Ion Beam
◽
Micro Ct
◽
Berea Sandstone
◽
Micro Computed Tomography
◽
Micro Structure
◽
Scanning Electron
Download Full-text
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Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy
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Attempt of quantitative analysis of morphological synaptic connectivity by combining focused ion beam milling and scanning electron microscopy (FIB–SEM) and confocal laser-scanning microscope
Neuroscience Research
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Focused Ion Beam
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