A review of sample thickness effects on high-resolution transmission electron microscopy imaging

Micron ◽  
2020 ◽  
Vol 130 ◽  
pp. 102813
Author(s):  
Shouqing Li ◽  
Yunjie Chang ◽  
Yumei Wang ◽  
Qiang Xu ◽  
Binghui Ge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Sample Thickness ◽  
Microscopy Imaging ◽  
Transmission Electron

scholarly journals Experimental observation of carousel-like phason flips in the decagonal quasicrystal Al60Cr20Fe10Si10

2021 ◽  
Vol 77 (5) ◽  
Author(s):  
Zhanbing He ◽  
Jean-Luc Maurice ◽  
Haikun Ma ◽  
Yanguo Wang ◽  
Hua Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
High Resolution ◽  
Translational Symmetry ◽  
Long Range Order ◽  
Decagonal Quasicrystal ◽  
Microscopy Imaging ◽  
Transmission Electron

Quasicrystals have special crystal structures with long-range order, but without translational symmetry. Unexpectedly, carousel-like successive flippings of groups of atoms inside the ∼2 nm decagonal structural subunits of the decagonal quasicrystal Al60Cr20Fe10Si10 were directly observed using in situ high-temperature high-resolution transmission electron microscopy imaging. The observed directionally successive phason flips occur mainly clockwise and occasionally anticlockwise. The origin of these directional phason flips is analyzed and discussed.

Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking

2010 ◽  
Vol 16 (2) ◽  
pp. 194-199 ◽  
Author(s):  
Florence Nelson ◽  
Alain C. Diebold ◽  
Robert Hull
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Random Noise ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Microscopy Imaging ◽  
Layer Graphene ◽  
Transmission Electron ◽  
Aberration Corrected

AbstractGraphene is a single layer of carbon atoms arranged in a hexagonal lattice. The high carrier mobility and mechanical robustness of single layer graphene make it an attractive material for “beyond CMOS” devices. The current work investigates through high-resolution transmission electron microscopy (HRTEM) image simulation the sensitivity of aberration-corrected HRTEM to the different graphene stacking configurations AAA/ABA/ABC as well as bilayers with rotational misorientations between the individual layers. High-angle annular dark field–scanning transmission electron microscopy simulation is also explored. Images calculated using the multislice approximation show discernable differences between the stacking sequences when simulated with realistic operating parameters in the presence of low random noise.

Quantitative determination of imaging parameters and composition from high-resolution transmission electron microscopy lattice images

1996 ◽  
Vol 54 ◽  
pp. 96-97
Author(s):  
D. Stenkamp
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Sample Thickness ◽  
Inelastic Electron ◽  
Local Composition ◽  
Transmission Electron ◽  
Non Linear ◽  
Lattice Images

A quantitative method for the direct determination of defocus Δf, local sample thickness t and local composition x from high-resolution transmission electron microscopy (HRTEM) lattice images of wedge-shaped samples is described. The method is applicable to a wide class of crystalline materials comprising elemental semiconductors, elemental metals and substitutional random alloys composed of these elements. The proposed method relies on the functional dependence of linear and non-linear image Fourier coefficients on the parameters defocus Δf, sample thickness t and composition x. This relationship is analytically derived by application of the Bloch wave formalism and the non-linear imaging theory to the HRTEM imaging process. Influences of inelastic electron scattering and partially coherent illumination conditions are taken into account explicitly.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

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