Reliability assessment of 1.55-μm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests

2009 ◽  
Vol 49 (1) ◽  
pp. 42-50 ◽  
Author(s):  
Keun Ho Rhew ◽  
Su Chang Jeon ◽  
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Byueng-Su Yoo ◽  
Ilgu Yun
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Charles A. Forman ◽  
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2001 ◽  
Vol 40 (Part 1, No. 10) ◽  
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Markus Ortsiefer ◽  
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...  

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