A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric

2016 ◽  
Vol 57 ◽  
pp. 24-33 ◽  
Author(s):  
Feng Ji ◽  
J.P. Xu ◽  
L. Liu ◽  
W.M. Tang ◽  
P.T. Lai
2014 ◽  
Vol 63 (8) ◽  
pp. 087301
Author(s):  
Fan Min-Min ◽  
Xu Jing-Ping ◽  
Liu Lu ◽  
Bai Yu-Rong ◽  
Huang Yong

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