Characterization of MIS structures and thin film transistors using RF-sputtered HfO 2 /HIZO layers

Microelectronics Reliability ◽

10.1016/j.microrel.2017.06.003 ◽

2017 ◽

Vol 75 ◽

pp. 9-13 ◽

Author(s):

I. Hernandez ◽

C.A. Pons-Flores ◽

I. Garduño ◽

J. Tinoco ◽

I. Mejia ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Download Full-text

Fabrication and Characterization of Cadmium Telluride based thin Film Transistors

SOP Transactions on Applied Physics ◽

10.15764/aphy.2014.02009 ◽

2014 ◽

Vol 2014 (2) ◽

pp. 74-80

Author(s):

M. G. Mahesha ◽

Keyword(s):

Thin Film ◽

Cadmium Telluride ◽

Thin Film Transistors ◽

Fabrication And Characterization

Download Full-text

Simulation and characterization of short-channel organic thin-film transistors fabricated using ink-jet printing and an imprint process

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4981930 ◽

2017 ◽

Vol 35 (3) ◽

pp. 032401

Author(s):

Juhyun Bae ◽

Kyohyeok Kim ◽

Namyong Kwon ◽

Ilsub Chung

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Organic Thin Film Transistors ◽

Organic Thin Film ◽

Short Channel ◽

Ink Jet Printing ◽

Ink Jet ◽

Download Full-text

Synthesis and Characterization of Novel p-Type Alkyl Bithiophene End-Capped Anthracene and Naphthalene Derivatives for Organic Thin-Film Transistors

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.5912 ◽

2012 ◽

Vol 12 (5) ◽

pp. 4299-4304 ◽

Author(s):

Hye Jin Koh ◽

Sang Hun Jang ◽

Chul Young Kim ◽

Sung Chul Shin ◽

Yun-Hi Kim ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Organic Thin Film Transistors ◽

Synthesis And Characterization ◽

Organic Thin Film ◽

Naphthalene Derivatives

Download Full-text

Fabrication and characterization of integrated uncooled infrared sensor arrays using a-Si thin-film transistors as active elements

Journal of Microelectromechanical Systems ◽

10.1109/jmems.2005.851807 ◽

2005 ◽

Vol 14 (5) ◽

pp. 1167-1177 ◽

Author(s):

Liang Dong ◽

Ruifeng Yue ◽

Litian Liu

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Sensor Arrays ◽

Infrared Sensor ◽

Active Elements ◽

Fabrication And Characterization ◽

Download Full-text

Electrical characterization of Cu-doped CdS p-type thin film transistors

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-021-07006-x ◽

2021 ◽

Author(s):

D. Berman-Mendoza ◽

O. I. Diaz-Grijalva ◽

R. López-Delgado ◽

A. Ramos-Carrazco ◽

M. E. Alvarez-Ramos ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Electrical Characterization ◽

Download Full-text

Front Cover: Synthesis and Characterization of Zirconium Disulfide Single Crystals and Thin-Film Transistors Based on Multilayer Zirconium Disulfide Flakes (ChemNanoMat 10/2018)

ChemNanoMat ◽

10.1002/cnma.201800426 ◽

2018 ◽

Vol 4 (10) ◽

pp. 1021-1021

Author(s):

Yoshihiro Shimazu ◽

Yutaro Fujisawa ◽

Kensuke Arai ◽

Tatsuya Iwabuchi ◽

Kazuya Suzuki

Keyword(s):

Thin Film ◽

Single Crystals ◽

Thin Film Transistors ◽

Synthesis And Characterization ◽

Download Full-text

Characterization of (100)-Dominantly Oriented Poly-Si Thin Film Transistors Using Multi-Line Beam Continuous-Wave Laser Lateral Crystallization

ECS Transactions ◽

10.1149/07510.0049ecst ◽

2016 ◽

Vol 75 (10) ◽

pp. 49-54

Author(s):

T. T. Nguyen ◽

M. Hiraiwa ◽

T. Hirata ◽

S.-I. Kuroki

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Continuous Wave ◽

Continuous Wave Laser ◽

Line Beam ◽

Lateral Crystallization ◽

Download Full-text

P-141L:Late-News Poster: Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors

SID Symposium Digest of Technical Papers ◽

10.1002/j.2168-0159.2012.tb05993.x ◽

2012 ◽

Vol 43 (1) ◽

pp. 1133-1136 ◽

Author(s):

Hyun Kwang Jeong ◽

Inseok Hur ◽

Woojoon Kim ◽

Jaehyeong Kim ◽

Dongsik Kong ◽

...

Keyword(s):

Thin Film ◽

Amorphous Silicon ◽

Physical Parameter ◽

Thin Film Transistors ◽

Wavelength Dependence ◽

Negative Bias ◽

Silicon Thin Film ◽

Negative Bias Illumination Stress

Download Full-text

Characterization of instability in amorphous silicon thin‐film transistors

Journal of Applied Physics ◽

10.1063/1.347577 ◽

1991 ◽

Vol 69 (10) ◽

pp. 7301-7305 ◽

Author(s):

Yoshiyuki Kaneko ◽

Akira Sasano ◽

Toshihisa Tsukada

Keyword(s):

Thin Film ◽

Amorphous Silicon ◽

Thin Film Transistors ◽

Silicon Thin Film

Download Full-text

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.80-81.367 ◽

2001 ◽

Vol 80-81 ◽

pp. 367-372

Author(s):

F.V. Farmakis ◽

D.M. Tsamados ◽

J. Brini ◽

G. Kamarinos ◽

C.A. Dimitriadis

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Noise Characterization

Download Full-text