Total ionizing dose and single event effects of 1 Mb HfO2-based resistive-random-access memory
2018 ◽
Vol 88-90
◽
pp. 891-897
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Keyword(s):
2018 ◽
Vol 65
(8)
◽
pp. 1708-1714
◽
2004 ◽
Vol 14
(02)
◽
pp. 285-298
◽
2016 ◽
Vol 67
◽
pp. 104-110
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Keyword(s):