Methods for in situ detection and characterization of extracellular polymers in biofilms by electron microscopy

2004 ◽  
Vol 57 (1) ◽  
pp. 55-64 ◽  
Author(s):  
M. Kämper ◽  
S. Vetterkind ◽  
R. Berker ◽  
M. Hoppert
Keyword(s):  
Electron Microscopy ◽  
Extracellular Polymers ◽  
In Situ Detection

scholarly journals Design and Characterization of Microscale Auxetic and Anisotropic Structures Fabricated by Multiphoton Lithography

Nanomaterials ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 446
Author(s):  
Ioannis Spanos ◽  
Zacharias Vangelatos ◽  
Costas Grigoropoulos ◽  
Maria Farsari
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Mechanical Performance ◽  
Element Analysis ◽  
Mechanical Responses ◽  
Multiphoton Lithography ◽  
Anisotropic Structures ◽  
Scanning Electron

The need for control of the elastic properties of architected materials has been accentuated due to the advances in modelling and characterization. Among the plethora of unconventional mechanical responses, controlled anisotropy and auxeticity have been promulgated as a new avenue in bioengineering applications. This paper aims to delineate the mechanical performance of characteristic auxetic and anisotropic designs fabricated by multiphoton lithography. Through finite element analysis the distinct responses of representative topologies are conveyed. In addition, nanoindentation experiments observed in-situ through scanning electron microscopy enable the validation of the modeling and the observation of the anisotropic or auxetic phenomena. Our results herald how these categories of architected materials can be investigated at the microscale.

scholarly journals Fabrication process and characterization of AgNPs/PVA/cellulose as a SERS platform for in-situ detection of residual pesticides in fruit

2020 ◽  
Vol 7 (3) ◽  
pp. 035019 ◽  
Author(s):  
Huong Nguyen Thi ◽  
Dai Hai Nguyen ◽  
Minh Thanh Vu ◽  
Huynh Nhu Tran ◽  
Linh Phuong Pham Tran ◽  
...  
Keyword(s):  
Fabrication Process ◽  
In Situ Detection

In Situ Electron Microscopy Four-Point Electromechanical Characterization of Freestanding Metallic and Semiconducting Nanowires

Small ◽  
2013 ◽  
Vol 10 (4) ◽  
pp. 725-733 ◽  
Author(s):  
Rodrigo A. Bernal ◽  
Tobin Filleter ◽  
Justin G. Connell ◽  
Kwonnam Sohn ◽  
Jiaxing Huang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Semiconducting Nanowires ◽  
In Situ Electron Microscopy ◽  
Electromechanical Characterization

scholarly journals The Importance of Complementary Information Provided by Surface Analysis, Electron Microscopy and in situ Characterization of Nanoparticles

2010 ◽  
Vol 16 (S2) ◽  
pp. 408-409 ◽  
Author(s):  
DR Baer ◽  
JE Amonette ◽  
A Dohnalkova ◽  
MH Engelhard ◽  
S Kuchibhatla ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Analysis ◽  
In Situ Characterization ◽  
Complementary Information

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Sign in / Sign up

Export Citation Format

Share Document