scholarly journals Development of an X-ray tube for irradiation experiments using a field emission electron gun

2016 ◽  
Vol 807 ◽  
pp. 41-46 ◽  
Author(s):  
Hidetoshi Kato ◽  
Brian E. O׳Rourke ◽  
Ryoichi Suzuki ◽  
Jiayu Wang ◽  
Takashi Ooi ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Gun ◽  
X Ray ◽  
Emission Electron

Observation of Phase Contrast Images in STEM and CTEM Modes by Using 100 kV Field Emission Electron Gun

1974 ◽  
Vol 32 ◽  
pp. 390-391
Author(s):  
Y. Harada ◽  
T. Goto ◽  
H. Koike ◽  
T. Someya
Keyword(s):  
Field Emission ◽  
Phase Contrast ◽  
Image Formation ◽  
Fresnel Diffraction ◽  
Experimental Results ◽  
Electron Gun ◽  
Scanning Microscopy ◽  
Emission Electron ◽  
Lattice Images

Since phase contrasts of STEM images, that is, Fresnel diffraction fringes or lattice images, manifest themselves in field emission scanning microscopy, the mechanism for image formation in the STEM mode has been investigated and compared with that in CTEM mode, resulting in the theory of reciprocity. It reveals that contrast in STEM images exhibits the same properties as contrast in CTEM images. However, it appears that the validity of the reciprocity theory, especially on the details of phase contrast, has not yet been fully proven by the experiments. In this work, we shall investigate the phase contrast images obtained in both the STEM and CTEM modes of a field emission microscope (100kV), and evaluate the validity of the reciprocity theory by comparing the experimental results.

WE-C-103-03: Design of a Novel 3D Field Emission Electron Source for High Power X-Ray Tube

2013 ◽  
Vol 40 (6Part29) ◽  
pp. 481-481
Author(s):  
Y Xu ◽  
D Li ◽  
J Zhang
Keyword(s):  
Field Emission ◽  
High Power ◽  
Electron Source ◽  
X Ray ◽  
Emission Electron

X-ray detection performance of a 300KV field-emission Analytical Electron Microscope

1993 ◽  
Vol 51 ◽  
pp. 250-251
Author(s):  
C. E. Lyman ◽  
J. I. Goldstein ◽  
D.B. Williams ◽  
D.W. Ackland ◽  
S. von Harrach ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Detection Performance ◽  
Electron Gun ◽  
X Rays ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope

A major goal of analytical electron micrsocopy (AEM) is to detect small amounts of an element in a given matrix at high spatial resolution. While there is a tradeoff between low detection limit and high spatial resolution, a field emission electron gun allows detection of small amounts of an element at sub-lOnm spatial resolution. The minimum mass fraction of one element measured in another is proportional to [(P/B)·P]-1/2 where the peak-to-background ratio P/B and the peak intensity P both must be high to detect the smallest amount of an element. Thus, the x-ray detection performance of an analytical electron microscope may be characterized in terms of standardized measurements of peak-to-background, x-ray intensity, the level of spurious x-rays (hole count), and x-ray detector performance in terms of energy resolution and peak shape.This paper provides measurements of these parameters from Lehigh’s VG Microscopes HB-603 field emission AEM. This AEM was designed to provide the best x-ray detection possible.

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