scholarly journals Summary of WG7—High brightness power sources: From laser technology to beam drivers

2018 ◽  
Vol 909 ◽  
pp. 450-451
Author(s):  
Leonida A. Gizzi ◽  
Barbara Marchetti ◽  
Pattathil P. Rajeev
Keyword(s):  
Power Sources ◽  
High Brightness ◽  
Laser Technology

RF Power Sources for High-Brightness RF Linacs

1988 ◽  
pp. 507-519
Author(s):  
Robert A. Jameson ◽  
Don W. Reid
Keyword(s):  
Rf Power ◽  
Power Sources ◽  
High Brightness

scholarly journals Low-dimensional moderators at ESS and compact neutron sources

2020 ◽  
Vol 231 ◽  
pp. 04006
Author(s):  
Luca Zanini ◽  
Esben Klinkby ◽  
Ferenc Mezei ◽  
Alan Takibayev
Keyword(s):  
Power Sources ◽  
High Brightness ◽  
Neutron Sources ◽  
Compact Source ◽  
Spallation Source ◽  
Lower Heat ◽  
Low Dimensional ◽  
Design Options ◽  
Compact Sources ◽  
Heat Loads

Low-dimensional moderators were designed for the European Spallation Source (ESS), and the same concepts can be applied to compact sources. At ESS, quasi two-dimensional (2D) high-brightness moderators will serve all the instruments of the initial suite. The design of the moderators is influenced by several factors, such as the layout of the facility, the requirements for beam extraction, and the number of instruments; these constraints led to the choice of the 2D “butterfly” moderator for ESS. In an accelerator-based compact source, such moderators can be designed in an even more efficient way than for high-power sources, taking advantage of the lower heat loads and of the more compact arrangement of the target-moderator system, which gives more freedom in the optimization of the geometrical setup. Some promising design options have been explored.

Latest advances in high power and high brightness laser technology

2019 ◽  
Author(s):  
Tracey Ryba ◽  
Sebastian Zaske ◽  
Sven-Silvius Schad ◽  
Alexander Killi
Keyword(s):  
High Power ◽  
High Brightness ◽  
Laser Technology

scholarly journals Development of High Brightness Solid-State Laser Technology

2020 ◽  
Vol 22 (3) ◽  
pp. 49
Author(s):  
Xiaojun Tang ◽  
Gang Wang ◽  
Jiao Liu ◽  
Lin Geng ◽  
Dongsheng Jiang
Keyword(s):  
Solid State ◽  
Solid State Laser ◽  
High Brightness ◽  
Laser Technology ◽  
State Laser

High power high brightness industrial fiber laser technology

2004 ◽  
Author(s):  
W. O’Neill ◽  
M. Sparkes ◽  
M. Varnham ◽  
R. Horley ◽  
M. Birch ◽  
...  
Keyword(s):  
Fiber Laser ◽  
High Power ◽  
High Brightness ◽  
Laser Technology

A Stable Field Emission Electron Source

1977 ◽  
Vol 35 ◽  
pp. 58-59
Author(s):  
W.R. Bottoms ◽  
G.B. Haydon
Keyword(s):  
Field Emission ◽  
Signal To Noise Ratio ◽  
High Brightness ◽  
Electron Sources ◽  
Brightness Field ◽  
Current Densities ◽  
Properties Of Materials ◽  
Stable Field ◽  
Stable Current ◽  
Careful Design

There is great interest in improving the brightness of electron sources and therefore the ability of electron optical instrumentation to probe the properties of materials. Extensive work by Dr. Crew and others has provided extremely high brightness sources for certain kinds of analytical problems but which pose serious difficulties in other problems. These sources cannot survive in conventional system vacuums. If one wishes to gather information from the other signal channels activated by electron beam bombardment it is necessary to provide sufficient current to allow an acceptable signal-to-noise ratio. It is possible through careful design to provide a high brightness field emission source which has the capability of providing high currents as well as high current densities to a specimen. In this paper we describe an electrode to provide long-lived stable current in field emission sources.The source geometry was based upon the results of extensive computer modeling. The design attempted to maximize the total current available at a specimen.

Optical Properties of HVEM Accelerators

1975 ◽  
Vol 33 ◽  
pp. 180-181
Author(s):  
A. Strojnik ◽  
J.W. Scholl ◽  
V. Bevc
Keyword(s):  
Optical Properties ◽  
Electron Accelerator ◽  
Systematic Investigation ◽  
Electron Source ◽  
High Brightness ◽  
The Past ◽  
Wide Range ◽  
Optical Behavior

The electron accelerator, as inserted between the electron source (injector) and the imaging column of the HVEM, is usually a strong lens and should be optimized in order to ensure high brightness over a wide range of accelerating voltages and illuminating conditions. This is especially true in the case of the STEM where the brightness directly determines the highest resolution attainable. In the past, the optical behavior of accelerators was usually determined for a particular configuration. During the development of the accelerator for the Arizona 1 MEV STEM, systematic investigation was made of the major optical properties for a variety of electrode configurations, number of stages N, accelerating voltages, 1 and 10 MEV, and a range of injection voltages ϕ0 = 1, 3, 10, 30, 100, 300 kV).

Characteristics and Application of Temperature-Field Emitters

1975 ◽  
Vol 33 ◽  
pp. 144-145
Author(s):  
N. Tamura ◽  
T. Goto ◽  
Y. Harada
Keyword(s):  
Temperature Field ◽  
Electron Microscope ◽  
Field Emission ◽  
Resolving Power ◽  
High Brightness ◽  
Field Emitters ◽  
Emission Electron ◽  
Sufficient Stability ◽  
Scanning Electron ◽  
Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

A comparative study on the cold type and thermal type field emission guns used in the same electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 58-59
Author(s):  
M. Iwatsuki ◽  
Y. Kokubo ◽  
Y. Harada
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Signal To Noise Ratio ◽  
Electron Source ◽  
Resolving Power ◽  
Optical Source ◽  
Experimental Conditions ◽  
High Brightness ◽  
Illumination System ◽  
Transmission Electron

On accout of its high brightness, small optical source size, and minimal energy spread, the field emission gun (FEG) has the advantage that it provides the conventional transmission electron microscope (TEM) with a highly coherent illumination system and directly improves the resolving power and signal-to-noise ratio of the scanning electron microscope (SEM). The FEG is generally classified into two types; the cold field emission (C-FEG) and thermal field emission gun (T-FEG). The former, in which a field emitter is used at the room temperature, was successfully developed as an electron source for the SEM. The latter, in which the emitter is heated to the temperature range of 1000-1800°K, was also proved to be very suited as an electron source for the TEM, as well as for the SEM. Some characteristics of the two types of the FEG have been studied and reported by many authors. However, the results of the respective types have been obtained separately under different experimental conditions.

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