A review of ion beam induced charge microscopy

2007 ◽  
Vol 264 (2) ◽  
pp. 345-360 ◽  
Author(s):  
M.B.H. Breese ◽  
E. Vittone ◽  
G. Vizkelethy ◽  
P.J. Sellin
Keyword(s):  
Ion Beam ◽  
Induced Charge

Analysis of power devices breakdown behaviour by ion beam and electron beam induced charge microscopy

2008 ◽  
Author(s):  
R. Siemieniec ◽  
A. Pugatschow ◽  
C. Geissler ◽  
H.-J. Schulze ◽  
F.-J. Niedernostheide ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ion Beam ◽  
Power Devices ◽  
Induced Charge

High signal to noise level ion beam induced charge images

1994 ◽  
Vol 64 (15) ◽  
pp. 1962-1964 ◽  
Author(s):  
M. B. H. Breese ◽  
J. S. Laird ◽  
G. R. Moloney ◽  
A. Saint ◽  
D. N. Jamieson
Keyword(s):  
Noise Level ◽  
Ion Beam ◽  
High Signal ◽  
Signal To Noise ◽  
Induced Charge

Ion Beam Induced Charge Collection Measurements Performed on GaN Based LEDs

2001 ◽  
Vol 186 (3) ◽  
pp. 461-469 ◽  
Author(s):  
L. Hirsch ◽  
A.S. Barri�re ◽  
P. Moretto
Keyword(s):  
Ion Beam ◽  
Charge Collection ◽  
Induced Charge

scholarly journals Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions

2015 ◽  
Vol 62 (6) ◽  
pp. 2919-2925
Author(s):  
Elizabeth C. Auden ◽  
Jose L. Pacheco ◽  
Edward Bielejec ◽  
Gyorgy Vizkelethy ◽  
John B. S. Abraham ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Ion Beam ◽  
Charge Reduction ◽  
Silicon Detectors ◽  
Induced Charge
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