Dense water downslope flow and AABW production in a numerical model: Sensitivity to horizontal and vertical resolution in the region off Cape Darnley polynya

2021 ◽  
pp. 101843
Author(s):  
Vigan Mensah ◽  
Yoshihiro Nakayama ◽  
Masakazu Fujii ◽  
Yoshifumi Nogi ◽  
Kay I. Ohshima
Keyword(s):  
Numerical Model ◽  
Vertical Resolution ◽  
Model Sensitivity ◽  
Dense Water ◽  
Downslope Flow

Outflow of dense water from the Storfjord in Svalbard: A numerical model study

1995 ◽  
Vol 100 (C12) ◽  
pp. 24719 ◽  
Author(s):  
Johann H. Jungclaus ◽  
Jan O. Backhaus ◽  
Hermann Fohrmann
Keyword(s):  
Numerical Model ◽  
Dense Water ◽  
Model Study ◽  
Numerical Model Study

Resolution in the scanning tunneling microscope

1991 ◽  
Vol 49 ◽  
pp. 488-489
Author(s):  
R. J. Wilson ◽  
D. D. Chambliss ◽  
S. Chiang ◽  
V. M. Hallmark
Keyword(s):  
Scanning Tunneling Microscope ◽  
Fundamental Principle ◽  
Atomic Scale ◽  
Lateral Resolution ◽  
Scanning Tunneling ◽  
Electronic Noise ◽  
Vertical Resolution ◽  
Tunneling Microscopy ◽  
Spatial Profile ◽  
Theoretical Analyses

Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral resolution in STM depends upon the spatial profile of electronic states of both the sample and tip at energies near the Fermi level. Vertical resolution is typically limited by mechanical and electronic noise.

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