Optical low coherence reflectometry for measuring a stationary Brillouin grating induced under uniform pumping in a short optical fiber

2017 ◽  
Vol 382 ◽  
pp. 646-650 ◽  
Author(s):  
Kazumasa Takada ◽  
Takahiro Yasuno
Keyword(s):  
Optical Fiber ◽  
Low Coherence ◽  
Optical Low Coherence Reflectometry

Optical low-coherence reflectometry (OLCR) characterization of efficient Bragg gratings in optical fiber

1993 ◽  
Author(s):  
Hans G. Limberger ◽  
Pierre-Yves Fonjallaz ◽  
Patrick Lambelet ◽  
Rene-Paul Salathe ◽  
Christophe Zimmer ◽  
...  
Keyword(s):  
Optical Fiber ◽  
Bragg Gratings ◽  
Low Coherence ◽  
Optical Low Coherence Reflectometry

Low Coherence Interferometry for Non-Invasive Semiconductor Monitoring

1993 ◽  
Vol 324 ◽  
Author(s):  
Chris M. Lawson ◽  
Robert R. Michael
Keyword(s):  
Solar Cell ◽  
Manufacturing Processes ◽  
Growth Monitoring ◽  
Low Coherence ◽  
Non Invasive ◽  
Low Coherence Interferometry ◽  
Silicon Growth ◽  
Silicon Thickness ◽  
Efficient Solar Cell ◽  
Optical Low Coherence Reflectometry

AbstractWe report on the first use of optical low coherence reflectometry (OLCR) for Edge Defined Film-Fed Growth (EFG) silicon characterization. This OLCR sensor system has been used to measure horizontal profiles of silicon thickness and flatness to an accuracy of 1.5 Rim with the sensor head positioned 1 cm away from the silicon. The use of this noninvasive sensor for EFG silicon growth monitoring may lead to more efficient solar cell manufacturing processes.

Effect of cross-sensitivity in low-coherence optical fiber interferometric sensor

2001 ◽  
Author(s):  
S. K. Ghorai ◽  
Shoumik Maiti ◽  
Harpreet Singh ◽  
Rana Bhowmick
Keyword(s):  
Optical Fiber ◽  
Cross Sensitivity ◽  
Low Coherence ◽  
Interferometric Sensor
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