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Effect of body bias on negative bias temperature instability in pMOSFET with SiON gate dielectrics
Solid-State Electronics
◽
10.1016/j.sse.2013.10.001
◽
2014
◽
Vol 91
◽
pp. 127-129
Author(s):
Hyojune Kim
◽
Yonghan Roh
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Body Bias
Download Full-text
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References
Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)
◽
10.1109/iedm.2001.979649
◽
2002
◽
Cited By ~ 22
Author(s):
C.H. Liu
◽
M.T. Lee
◽
Chih-Yung Lin
◽
J. Chen
◽
K. Schruefer
◽
...
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Negative bias temperature instability (NBTI) in SiO2 and SiON gate dielectrics understood through disorder-controlled kinetics
Microelectronic Engineering
◽
10.1016/j.mee.2005.04.054
◽
2005
◽
Vol 80
◽
pp. 122-125
◽
Cited By ~ 36
Author(s):
B. Kaczer
◽
V. Arkhipov
◽
M. Jurczak
◽
G. Groeseneken
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
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Effects of a HfMoN Metal Gate and Self-Aligned Fluorine-Ion Implantation on the Negative-Bias Temperature Instability of pMOSFETs With $\hbox{Gd}_{2} \hbox{O}_{3}$ Gate Dielectrics
IEEE Electron Device Letters
◽
10.1109/led.2011.2157300
◽
2011
◽
Vol 32
(8)
◽
pp. 1017-1019
Author(s):
Jer-Chyi Wang
◽
Hsing-Kan Peng
◽
Chao-Sung Lai
◽
Pai-Chi Chou
◽
Min-Jer Lee
Keyword(s):
Ion Implantation
◽
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Metal Gate
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
Negative bias temperature instability of pMOSFETs with ultra-thin SiON gate dielectrics
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
◽
10.1109/relphy.2003.1197743
◽
2003
◽
Cited By ~ 42
Author(s):
S. Tsujikawa
◽
T. Mine
◽
K. Watanabe
◽
Y. Shimamoto
◽
R. Tsuchiya
◽
...
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
Negative bias temperature instability of Rf-sputtered Mg0.05Zn0.95O thin film transistors with MgO gate dielectrics
Semiconductor Science and Technology
◽
10.1088/0268-1242/26/10/105007
◽
2011
◽
Vol 26
(10)
◽
pp. 105007
◽
Cited By ~ 13
Author(s):
Chih-Hung Li
◽
Yi-Shiuan Tsai
◽
Jian Z Chen
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
Degradation caused by Negative Bias temperature instability depending on Body Bias on NMOS or PMOS in 65 nm bulk and thin-BOX FDSOI processes
2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
◽
10.1109/edtm.2017.7947535
◽
2017
◽
Author(s):
Ryo Kishida
◽
Kazutoshi Kobayashi
Keyword(s):
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Body Bias
Download Full-text
Negative-bias-temperature-instability (NBTI) for p/sup +/-gate pMOSFET with ultra-thin plasma-nitrided gate dielectrics
7th International Symposium on Plasma- and Process-Induced Damage
◽
10.1109/ppid.2002.1042630
◽
2003
◽
Author(s):
Shyue-Seng Tan
◽
Tupei Chen
◽
Chow-Hoe Ang
◽
C. Lek
◽
Werthe Lin
◽
...
Keyword(s):
Gate Dielectrics
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Thin Plasma
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Experimental and theoretical studies of negative bias temperature instability in ultra-thin gate dielectrics
10.32657/10356/3384
◽
2005
◽
Author(s):
Shyue Seng Tan
Keyword(s):
Gate Dielectrics
◽
Theoretical Studies
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Experimental And Theoretical Studies
Download Full-text
Effect of Gate Oxide Thickness on Negative Bias Temperature Instability in p-Mosfet with Sion Gate Dielectrics
ECS Meeting Abstracts
◽
10.1149/ma2016-01/16/1020
◽
2016
◽
Keyword(s):
Gate Dielectrics
◽
Gate Oxide
◽
Oxide Thickness
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
◽
Gate Oxide Thickness
Download Full-text
Influence of bulk bias on negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with ultrathin SiON gate dielectrics
Journal of Applied Physics
◽
10.1063/1.2183409
◽
2006
◽
Vol 99
(6)
◽
pp. 064510
◽
Cited By ~ 12
Author(s):
Shiyang Zhu
◽
Anri Nakajima
◽
Takuo Ohashi
◽
Hideharu Miyake
Keyword(s):
Metal Oxide
◽
Field Effect
◽
Gate Dielectrics
◽
Field Effect Transistors
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Negative Bias
◽
Negative Bias Temperature Instability
◽
Temperature Instability
◽
Bias Temperature Instability
Download Full-text
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