Ellipsometric and XPS characterization of transparent nickel oxide thin films deposited by reactive HiPIMS

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2014.02.014 ◽

2014 ◽

Vol 250 ◽

pp. 21-25 ◽

Author(s):

D.T. Nguyen ◽

A. Ferrec ◽

J. Keraudy ◽

M. Richard-Plouet ◽

A. Goullet ◽

...

Keyword(s):

Nickel Oxide ◽

Oxide Thin Films ◽

Xps Characterization ◽

Nickel Oxide Thin Films

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XRD and XPS characterization of electrochromic nickel oxide thin films prepared by electrolysis–chemical deposition

Journal of the Chemical Society Faraday Transactions ◽

10.1039/a806459h ◽

1998 ◽

Vol 94 (24) ◽

pp. 3665-3670 ◽

Author(s):

Masaya Chigane ◽

Masami Ishikawa

Keyword(s):

Nickel Oxide ◽

Chemical Deposition ◽

Oxide Thin Films ◽

Xps Characterization ◽

Nickel Oxide Thin Films

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Synthesis and characterization of nickel oxide thin films deposited on glass substrates using spray pyrolysis

Applied Surface Science ◽

10.1016/j.apsusc.2014.04.134 ◽

2014 ◽

Vol 308 ◽

pp. 199-205 ◽

Author(s):

M. Jlassi ◽

I. Sta ◽

M. Hajji ◽

H. Ezzaouia

Keyword(s):

Nickel Oxide ◽

Spray Pyrolysis ◽

Synthesis And Characterization ◽

Oxide Thin Films ◽

Glass Substrates ◽

Nickel Oxide Thin Films

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Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2009.12.011 ◽

2010 ◽

Vol 94 (5) ◽

pp. 724-732 ◽

Author(s):

I. Valyukh ◽

S. Green ◽

H. Arwin ◽

G.A. Niklasson ◽

E. Wäckelgård ◽

...

Keyword(s):

Nickel Oxide ◽

Tungsten Oxide ◽

Spectroscopic Ellipsometry ◽

Sputter Deposition ◽

Oxide Thin Films ◽

Nickel Oxide Thin Films

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ELECTRICAL CHARACTERIZATION OF NICKEL OXIDE THIN FILMS DEPOSITED BY REACTIVE SPUTTERING FOR MEMORY APPLICATIONS

Integrated Ferroelectrics ◽

10.1080/10584580500413921 ◽

2005 ◽

Vol 74 (1) ◽

pp. 71-77 ◽

Author(s):

JANG WOO LEE ◽

IK HYUN PARK ◽

CHEE WON CHUNG

Keyword(s):

Nickel Oxide ◽

Electrical Characterization ◽

Reactive Sputtering ◽

Oxide Thin Films ◽

Memory Applications ◽

Nickel Oxide Thin Films

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Characterization of electrochromic nickel oxide thin films prepared by anodic deposition

Journal of the Chemical Society Faraday Transactions ◽

10.1039/ft9928802203 ◽

1992 ◽

Vol 88 (15) ◽

pp. 2203 ◽

Author(s):

Masaya Chigane ◽

Masami Ishikawa

Keyword(s):

Nickel Oxide ◽

Oxide Thin Films ◽

Anodic Deposition ◽

Nickel Oxide Thin Films

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Preparation and characterization of nickel oxide thin films by a simple two-step method

2010 8th International Vacuum Electron Sources Conference and Nanocarbon ◽

10.1109/ivesc.2010.5644175 ◽

2010 ◽

Author(s):

C.Y. Li ◽

Z.W. Zhao

Keyword(s):

Nickel Oxide ◽

Oxide Thin Films ◽

Step Method ◽

Nickel Oxide Thin Films

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Metallic-mode reactive sputtering of nickel oxide thin films and characterization of their electrochromic properties

Japanese Journal of Applied Physics ◽

10.7567/1347-4065/ab1189 ◽

2019 ◽

Vol 58 (5) ◽

pp. 055504 ◽

Author(s):

Yuki Yokoiwa ◽

Yoshio Abe ◽

Midori Kawamura ◽

Kyung Ho Kim ◽

Takayuki Kiba

Keyword(s):

Nickel Oxide ◽

Reactive Sputtering ◽

Oxide Thin Films ◽

Electrochromic Properties ◽

Nickel Oxide Thin Films

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Preparation and characterization of nanostructured nickel oxide thin films by spray pyrolysis

Applied Nanoscience ◽

10.1007/s13204-012-0152-2 ◽

2012 ◽

Vol 3 (6) ◽

pp. 509-514 ◽

Author(s):

Raid A. Ismail ◽

Sa’ad Ghafori ◽

Ghada A. Kadhim

Keyword(s):

Nickel Oxide ◽

Spray Pyrolysis ◽

Oxide Thin Films ◽

Nickel Oxide Thin Films

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Characterization of nanocrystalline nickel oxide thin films prepared at different thermal oxidation temperatures

Journal of Nanostructure in Chemistry ◽

10.1007/s40097-020-00332-2 ◽

2020 ◽

Vol 10 (1) ◽

pp. 97-103 ◽

Author(s):

Fatemeh Hajakbari

Keyword(s):

Nickel Oxide ◽

Thermal Oxidation ◽

Oxide Thin Films ◽

Nanocrystalline Nickel ◽

Nickel Oxide Thin Films

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Growth, physical and electrical characterization of nickel oxide thin films prepared by plasma-enhanced atomic layer deposition using nickelocene and oxygen precursors

Materials Research Express ◽

10.1088/2053-1591/ab82c9 ◽

2020 ◽

Vol 7 (4) ◽

pp. 046401

Author(s):

Lin-Yan Xie ◽

Dong-Qi Xiao ◽

Jun-Xiang Pei ◽

Jingyong Huo ◽

Xiaohan Wu ◽

...

Keyword(s):

Atomic Layer Deposition ◽

Nickel Oxide ◽

Electrical Characterization ◽

Atomic Layer ◽

Oxide Thin Films ◽

Layer Deposition ◽

Nickel Oxide Thin Films

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