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2004 ◽  
Vol 146 (3) ◽  
pp. 317-320 ◽  
Author(s):  
T. Muck ◽  
V. Wagner ◽  
U. Bass ◽  
M. Leufgen ◽  
J. Geurts ◽  
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Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization

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J. Zhong ◽  
X. Jing ◽  
K. V. Singh ◽  
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Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization ◽  
Scanning Gate Microscopy ◽  
Scanning Gate

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2D Materials ◽  
2020 ◽  
Vol 8 (1) ◽  
pp. 012002 ◽  
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Sekhar Babu Mitta ◽  
Min Sup Choi ◽  
Ankur Nipane ◽  
Fida Ali ◽  
Changsik Kim ◽  
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Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
2D Materials ◽  
Electrical Characterization

scholarly journals In-situ Characterization of MoS2 Based Field Effect Transistors during Ion Irradiation

2020 ◽  
Vol 26 (S2) ◽  
pp. 294-296
Author(s):  
Gregor Hlawacek ◽  
Zahra Fekri ◽  
Panish Chava ◽  
Artur Erbe
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Field Effect ◽  
Field Effect Transistors ◽  
Ion Irradiation ◽  
In Situ Characterization

Fabrication and Electrical Characterization of Lambda DNA Field Effect Transistors

2007 ◽  
Author(s):  
Jong-Seung Hwang ◽  
Maeng Ho Son ◽  
Sung Woo Hwang ◽  
Doyeol Ahn
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization ◽  
Lambda Dna
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