Nanoscale in situ study of ZDDP tribofilm growth at aluminum-based interfaces using atomic force microscopy

Tribology International ◽

10.1016/j.triboint.2019.106075 ◽

2020 ◽

Vol 143 ◽

pp. 106075 ◽

Author(s):

N.N. Gosvami ◽

I. Lahouij ◽

J. Ma ◽

R.W. Carpick

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

In Situ Study ◽

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In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy

Applied Surface Science ◽

10.1016/j.apsusc.2018.05.020 ◽

2018 ◽

Vol 452 ◽

pp. 67-74 ◽

Author(s):

Shiqiang Huang ◽

Ling-Zhi Cheong ◽

Shuwei Wang ◽

Deyu Wang ◽

Cai Shen

Keyword(s):

Atomic Force Microscopy ◽

Surface Structure ◽

Structure Evolution ◽

Force Microscopy ◽

Silicon Anodes ◽

In Situ Study ◽

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In situ study of the recovery of nanoindentation deformation of the (100) face of MgO crystals by atomic force microscopy

Surface Science ◽

10.1016/s0039-6028(99)00909-7 ◽

1999 ◽

Vol 442 (2) ◽

pp. 161-178 ◽

Author(s):

K Sangwal ◽

P Gorostiza ◽

F Sanz

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

In Situ Study ◽

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In Situ Study of the Cathode Electrolyte Interphase in High Voltage Cycling with Atomic Force Microscopy

ECS Meeting Abstracts ◽

10.1149/ma2016-03/2/97 ◽

2016 ◽

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Force Microscopy ◽

In Situ Study ◽

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In Situ Study of Soft Matter with Atomic Force Microscopy and Light Scattering

Progress in Colloid and Polymer Science - Trends in Colloid and Interface Science XIV ◽

10.1007/3-540-46545-6_57 ◽

2007 ◽

pp. 295-299 ◽

Author(s):

C. Neto ◽

D. Berti ◽

G. D. Aloisi ◽

P. Baglioni ◽

K. Larsson

Keyword(s):

Atomic Force Microscopy ◽

Light Scattering ◽

Soft Matter ◽

Force Microscopy ◽

In Situ Study ◽

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Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts

Applied Physics Letters ◽

10.1063/1.3177065 ◽

2009 ◽

Vol 95 (5) ◽

pp. 051904 ◽

Author(s):

Marcel Lucas ◽

Zhong Lin Wang ◽

Elisa Riedo

Keyword(s):

Mechanical Properties ◽

Atomic Force Microscopy ◽

Point Defects ◽

Force Microscopy ◽

In Situ Study ◽

Atomic Force ◽

Polarized Raman

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An in Situ Study of Metal Complexation by an Immobilized Synthetic Biopolymer Using Tapping Mode Liquid Cell Atomic Force Microscopy

Analytical Chemistry ◽

10.1021/ac010122p ◽

2001 ◽

Vol 73 (17) ◽

pp. 4087-4095 ◽

Author(s):

Thomasin C. Miller ◽

Eun-Soo Kwak ◽

Maury E. Howard ◽

David A. Vanden Bout ◽

James A. Holcombe

Keyword(s):

Atomic Force Microscopy ◽

Metal Complexation ◽

Tapping Mode ◽

Force Microscopy ◽

In Situ Study ◽

Atomic Force ◽

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In vitro bioactivity of starch thermoplastic/hydroxyapatite composite biomaterials: an in situ study using atomic force microscopy

Biomaterials ◽

10.1016/s0142-9612(02)00371-x ◽

2003 ◽

Vol 24 (4) ◽

pp. 579-585 ◽

Author(s):

I Leonor

Keyword(s):

Atomic Force Microscopy ◽

In Vitro Bioactivity ◽

Force Microscopy ◽

In Situ Study ◽

Atomic Force ◽

Hydroxyapatite Composite ◽

Composite Biomaterials

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In situ studies of the spiral growth of zinc thiourea sulphate crystals with ethylene diamine tetraacetic acid doped by atomic force microscopy

Crystal Research and Technology ◽

10.1002/crat.201400107 ◽

2014 ◽

Vol 49 (9) ◽

pp. 743-752 ◽

Author(s):

Jie Song ◽

Mingwei Li ◽

Min Cheng ◽

Zhitao Hu ◽

Yachao Cao

Keyword(s):

Atomic Force Microscopy ◽

Ethylene Diamine Tetraacetic Acid ◽

Spiral Growth ◽

Ethylene Diamine ◽

Tetraacetic Acid ◽

Force Microscopy ◽

In Situ Studies ◽

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Atomic force microscopy of in situ deformed nickel thin films

Thin Solid Films ◽

10.1016/s0040-6090(99)00369-7 ◽

1999 ◽

Vol 353 (1-2) ◽

pp. 194-200 ◽

Author(s):

C. Coupeau ◽

J.F. Naud ◽

F. Cleymand ◽

P. Goudeau ◽

J. Grilhé

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nickel Thin Films ◽

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In Situ Observation of Low‐Power Nano‐Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Small ◽

10.1002/smll.202101100 ◽

2021 ◽

pp. 2101100

Author(s):

Fei Hui ◽

Peisong Liu ◽

Stephen A. Hodge ◽

Tian Carey ◽

Chao Wen ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Graphene Oxide ◽

Low Power ◽

In Situ Observation ◽

Synaptic Response ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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