Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions
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2002 ◽
Vol 201
(1-4)
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pp. 138-145
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2003 ◽
Vol 21
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pp. 1351-1354
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2009 ◽
Vol 469
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pp. 313-317
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1998 ◽
Vol 313-314
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pp. 394-397
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2016 ◽
Vol 3
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pp. 116408
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