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Influence of oxygen transfer in Hf-based high-k dielectrics on flatband voltage shift
Thin Solid Films
◽
10.1016/j.tsf.2011.10.086
◽
2012
◽
Vol 520
(8)
◽
pp. 3387-3391
◽
Cited By ~ 7
Author(s):
Toshihide Nabatame
◽
Masayuki Kimura
◽
Hiroyuki Yamada
◽
Akihiko Ohi
◽
Tomoji Ohishi
◽
...
Keyword(s):
Oxygen Transfer
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
Download Full-text
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References
Role of Oxygen Transfer for High-k/SiO2/Si Stack Structure on Flatband Voltage Shift
ECS Transactions
◽
10.1149/1.3572296
◽
2019
◽
Vol 35
(4)
◽
pp. 403-416
◽
Cited By ~ 5
Author(s):
Toshihide Nabatame
◽
Akihiko Ohi
◽
Toyohiro Chikyow
Keyword(s):
Oxygen Transfer
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
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Comprehensive understanding of the effect of electric dipole at high-k/SiO2 interface on the flatband voltage shift in metal-oxide-semiconductor device
Applied Physics Letters
◽
10.1063/1.3475774
◽
2010
◽
Vol 97
(6)
◽
pp. 062901
◽
Cited By ~ 19
Author(s):
Xiaolei Wang
◽
Kai Han
◽
Wenwu Wang
◽
Xueli Ma
◽
Dapeng Chen
◽
...
Keyword(s):
Metal Oxide
◽
Electric Dipole
◽
Semiconductor Device
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Comprehensive Understanding
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
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Hf-doped and NH3-nitrided high-K gate dielectric thin film with least drain current degradation and flatband voltage shift
Electronics Letters
◽
10.1049/el:20030988
◽
2003
◽
Vol 39
(21)
◽
pp. 1499
◽
Cited By ~ 3
Author(s):
C.W. Yang
◽
Y.K. Fang
◽
C.S. Lin
◽
Y.S. Tsair
◽
S.M. Chen
◽
...
Keyword(s):
Thin Film
◽
Gate Dielectric
◽
Drain Current
◽
Dielectric Thin Film
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
◽
High K Gate Dielectric
Download Full-text
Experimental evidence for the flatband voltage shift of high-k metal-oxide-semiconductor devices due to the dipole formation at the high-k∕SiO2 interface
Applied Physics Letters
◽
10.1063/1.2904650
◽
2008
◽
Vol 92
(13)
◽
pp. 132907
◽
Cited By ~ 118
Author(s):
Kunihiko Iwamoto
◽
Yuuichi Kamimuta
◽
Arito Ogawa
◽
Yukimune Watanabe
◽
Shinji Migita
◽
...
Keyword(s):
Metal Oxide
◽
Experimental Evidence
◽
Semiconductor Devices
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
Download Full-text
Effect of polycrystalline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal–oxide–semiconductor field-effect transistors for high-k-HfO2 dielectric
Applied Physics Letters
◽
10.1063/1.1592634
◽
2003
◽
Vol 83
(2)
◽
pp. 308-310
◽
Cited By ~ 27
Author(s):
C. W. Yang
◽
Y. K. Fang
◽
C. H. Chen
◽
S. F. Chen
◽
C. Y. Lin
◽
...
Keyword(s):
Metal Oxide
◽
Polycrystalline Silicon
◽
Field Effect
◽
Field Effect Transistors
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
◽
P Type
Download Full-text
Effect of Al-diffusion-induced positive flatband voltage shift on the electrical characteristics of Al-incorporated high-k metal-oxide-semiconductor field-effective transistor
Journal of Applied Physics
◽
10.1063/1.3093892
◽
2009
◽
Vol 105
(6)
◽
pp. 064108
◽
Cited By ~ 14
Author(s):
Wenwu Wang
◽
Koji Akiyama
◽
Wataru Mizubayashi
◽
Toshihide Nabatame
◽
Hiroyuki Ota
◽
...
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Electrical Characteristics
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
Download Full-text
Analysis of flatband voltage shift of metal/high- k /SiO 2 /Si stack based on energy band alignment of entire gate stack
Chinese Physics B
◽
10.1088/1674-1056/23/11/117702
◽
2014
◽
Vol 23
(11)
◽
pp. 117702
◽
Cited By ~ 1
Author(s):
Kai Han
◽
Xiao-Lei Wang
◽
Yong-Gui Xu
◽
Hong Yang
◽
Wen-Wu Wang
Keyword(s):
Energy Band
◽
Band Alignment
◽
Gate Stack
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
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Millisecond Flash Annealing as a Flatband Voltage Shift Enabler for p-Type Metal-Oxide-Semiconductor Devices with High-k/Metal Gate
Electrochemical and Solid-State Letters
◽
10.1149/1.3566073
◽
2011
◽
Vol 14
(6)
◽
pp. H241
◽
Cited By ~ 1
Author(s):
Changhwan Choi
◽
Vijay Narayanan
Keyword(s):
Metal Oxide
◽
Semiconductor Devices
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Metal Gate
◽
Voltage Shift
◽
Flash Annealing
◽
High K
◽
Flatband Voltage
◽
P Type
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Origin of Flatband Voltage Shift in Poly-Si/Hf-Based High-k Gate Dielectrics and Flatband Voltage Dependence on Gate Stack Structure
Japanese Journal of Applied Physics
◽
10.1143/jjap.43.7843
◽
2004
◽
Vol 43
(11B)
◽
pp. 7843-7847
◽
Cited By ~ 6
Author(s):
Makoto Miyamura
◽
Koji Masuzaki
◽
Heiji Watanabe
◽
Nobuyuki Ikarashi
◽
Toru Tatsumi
Keyword(s):
Voltage Dependence
◽
Gate Dielectrics
◽
Gate Stack
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
Download Full-text
Comprehensive Understanding of Flatband Voltage Shift Based on Energy Band Alignment of the Whole Metal/high-k/SiO2/Si Stack
10.7567/ssdm.2011.p-1-12
◽
2011
◽
Author(s):
X. Wang
◽
W. Wang
◽
K. Han
◽
J. Zhang
◽
X. Ma
◽
...
Keyword(s):
Energy Band
◽
Band Alignment
◽
Comprehensive Understanding
◽
Voltage Shift
◽
High K
◽
Flatband Voltage
Download Full-text
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