scholarly journals Quantitative depth profiling of Si1–xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry

2016 ◽  
Vol 607 ◽  
pp. 25-31 ◽  
Author(s):  
M.N. Drozdov ◽  
Y.N. Drozdov ◽  
A. Csik ◽  
A.V. Novikov ◽  
K. Vad ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Depth profiling of fullerene-containing structures by time-of-flight secondary ion mass spectrometry

2013 ◽  
Vol 39 (12) ◽  
pp. 1097-1100 ◽  
Author(s):  
M. N. Drozdov ◽  
Yu. N. Drozdov ◽  
G. L. Pakhomov ◽  
V. V. Travkin ◽  
P. A. Yunin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals 3-D Molecular Depth Profiling of Biological and Polymeric Materials Using Time-of-Flight Secondary Ion Mass Spectrometry

2013 ◽  
Vol 19 (S2) ◽  
pp. 664-665
Author(s):  
P.A. Clark ◽  
E. Tallarek ◽  
D. Breitenstein ◽  
B. Hagenhoff ◽  
N. Havercroft
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Polymeric Materials ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Secondary Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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