Atomic force microscopy and in situ-annealing X-ray diffraction study on template-stripped gold substrates for optimum self-assembled monolayer deposition

2021 ◽  
pp. 138978
Author(s):  
E. Sanchez-Adaime ◽  
D. Duché ◽  
S. Escoubas ◽  
V. Jangid ◽  
L. Nony ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
Self Assembled Monolayer ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gold Substrates ◽  
Self Assembled

Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

2020 ◽  
Vol 98 (5) ◽  
pp. 365-375
Author(s):  
Andrea Quintero ◽  
Patrice Gergaud ◽  
Jean-Michel Hartmann ◽  
Vincent Delaye ◽  
Nicolas Bernier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Probing the structural evolution in deformed isoprene rubber by in situ synchrotron X-ray diffraction and atomic force microscopy

Polymer ◽  
2019 ◽  
Vol 185 ◽  
pp. 121926 ◽  
Author(s):  
Shuquan Sun ◽  
Fengyan Hu ◽  
Thomas P. Russell ◽  
Dong Wang ◽  
Liqun Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Structural Evolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Isoprene Rubber

An unexpected packing of fluorinated n‐alkane thiols on Au(111): A combined atomic force microscopy and x‐ray diffraction study

1994 ◽  
Vol 101 (5) ◽  
pp. 4301-4306 ◽  
Author(s):  
Gang‐yu Liu ◽  
Paul Fenter ◽  
Christopher E. D. Chidsey ◽  
D. Frank Ogletree ◽  
Peter Eisenberger ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Alkane Thiols

Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers

1996 ◽  
Vol 156 (1-3) ◽  
pp. 109-110 ◽  
Author(s):  
K. Temst ◽  
M.J. Van Bael ◽  
D.G. de Groot ◽  
N.J. Koeman ◽  
R.P. Griessen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diffraction Study ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force

Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction

2009 ◽  
Vol 94 (2) ◽  
pp. 023109 ◽  
Author(s):  
T. Scheler ◽  
M. Rodrigues ◽  
T. W. Cornelius ◽  
C. Mocuta ◽  
A. Malachias ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

In situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction

2009 ◽  
Vol 106 (10) ◽  
pp. 103525 ◽  
Author(s):  
M. S. Rodrigues ◽  
T. W. Cornelius ◽  
T. Scheler ◽  
C. Mocuta ◽  
A. Malachias ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Deformation ◽  
In Situ Observation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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