Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples

2004 ◽  
Vol 101 (2-4) ◽  
pp. 183-195 ◽  
Author(s):  
W.K. Wong ◽  
E.I. Rau ◽  
J.T.L. Thong
2018 ◽  
Vol 44 (4) ◽  
pp. 287-291
Author(s):  
Rafael Manfro ◽  
Gislaine Felipe Garcia ◽  
Marcelo Carlos Bortoluzzi ◽  
Vinicius Fabris ◽  
Atais Bacchi ◽  
...  

2018 ◽  
Vol 12 (03) ◽  
pp. 403-409 ◽  
Author(s):  
Ricardo Machado ◽  
Daniel Comparin ◽  
Eduardo Donato Eing Engelke Back ◽  
Lucas da Fonseca Roberti Garcia ◽  
Luiz Rômulo Alberton

ABSTRACT Objective: The purpose of this study was to compare the amount of residual smear layer after root canal instrumentation by using Ni-Ti, M-Wire, and CM-Wire instruments. Materials and Methods: Seventy-two mandibular incisors were randomly divided into six groups according to the system used: WaveOne (WO), Reciproc (RP), Unicone (UC), ProTaper Next (PN), Mtwo (MT), and HyFlex (HF). Afterward, the specimens were cleaved in the mesiodistal and buccolingual direction for analysis by scanning electron microscopy. Results: Considering both directions and root canal thirds, there was no difference between HF, MT, and PN. RP, UC, and WO presented a significant difference between the directions, and the cervical third showed a significantly smaller quantity of residual smear layer compared with the apical third. When the systems were compared among them, there was a significant difference only between RP and WO. Conclusions: Residual smear layer observed after instrumentation with the different systems was similar, except for quantities between the reciprocating systems.


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