Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods

2013 ◽  
Vol 134 ◽  
pp. 94-101 ◽  
Author(s):  
Florian F. Krause ◽  
Knut Müller ◽  
Dennis Zillmann ◽  
Jacob Jansen ◽  
Marco Schowalter ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Simulation Methods ◽  
Transmission Electron ◽  
Microscopy Images

Characterization of the ZnSe/GaAs Interface Layer by Tem and Spectroscopic Ellipsometry

1992 ◽  
Vol 280 ◽  
Author(s):  
R. Dahmani ◽  
L. Salamanca-Riba ◽  
D. P. Beesabathina ◽  
N. V. Nguyen ◽  
D. Chandler-Horowitz ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spectroscopic Ellipsometry ◽  
Interface Layer ◽  
Transmission Electron ◽  
Three Phase ◽  
Znse Thin Films ◽  
Microscopy Images

ABSTRACTThe interface between ZnSe thin films and GaAs substrates is characterized by High Resolution Transmission Electron Microscopy and room temperature Spectroscopic Ellipsometry. The films were grown on (001) GaAs by Molecular Beam Epitaxy. A three-phase model is used in the reduction of the ellipsometric data, from which the presence of a transition layer of Ga2Se3, with a thickness of less than 1 nm, is confirmed. These results corroborate the high resolution transmission electron microscopy images obtained from the same samples.

scholarly journals Development of an Algorithm for Automatic Image Detection of Biological Particles in Transmission Electron Microscopy Images

2012 ◽  
Vol 18 (S5) ◽  
pp. 3-4 ◽  
Author(s):  
M. C. Proença ◽  
J. F. Moura Nunes ◽  
A. P. Alves de Matos
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
3D Reconstruction ◽  
Image Detection ◽  
Virus Particles ◽  
Transmission Electron ◽  
Automatic Image Processing ◽  
Microscopy Images

Automatic image processing of transmission electron microscopy images (TEM) is a utopia often pursued, considering the thousands of images necessary to ensure a high resolution 3D reconstruction of virus particles or other macromolecular machines.

REW– exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images

2007 ◽  
Vol 40 (3) ◽  
pp. 614-614 ◽  
Author(s):  
F. Lin ◽  
Q. Chen ◽  
L.-M. Peng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Maximum Likelihood Method ◽  
Transmission Electron Microscopy Image ◽  
Likelihood Method ◽  
Transmission Electron ◽  
Microscopy Image ◽  
Focus Variation ◽  
Microscopy Images

A Windows-based computer program has been developed for exit-wave reconstruction and experimental high-resolution transmission electron microscopy image alignment. While the exit-wave reconstruction is performed mainly using the maximum-likelihood method, image alignments may be carried out using several algorithms, including the time-consuming but robust genetic algorithm.

A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

2014 ◽  
Vol 116 (10) ◽  
pp. 104905 ◽  
Author(s):  
Fangzhen Wu ◽  
Huanhuan Wang ◽  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Stephan G. Mueller ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Transmission Electron ◽  
Microscopy Images

Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC

1999 ◽  
Vol 5 (6) ◽  
pp. 420-427 ◽  
Author(s):  
U. Kaiser ◽  
A. Chuvilin ◽  
P.D. Brown ◽  
W. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Molecular Beam ◽  
Dark Field ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Field Imaging ◽  
Microscopy Images ◽  
Image Simulations

Abstract: High-resolution transmission electron microscopy (HRTEM) images of the [1–10] zone of cubic SiC layers grown by molecular beam epitaxy (MBE) often reveal regions of material exhibiting an unusual threefold periodicity. The same contrast was found in earlier works of Jepps and Page, who attributed this contrast in HRTEM images of polycrystalline SiC to the 9R-SiC polytype. In this report we demonstrate by HRTEM image simulations that the model of the 9R polytype and an alternative twinning model can fit qualitatively the experimental HRTEM images. However, by comparing the fast Fourier transform (FFT) patterns of the experiments and the simulations, as well as by using dark-field imaging, we show unambiguously that only the model of overlapping twinned 3C-SiC crystals fully agrees with the experiments.

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