Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116, 104905 (2014)]
2012 ◽
Vol 18
(S5)
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pp. 3-4
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2007 ◽
Vol 40
(3)
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pp. 614-614
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2000 ◽
Vol 12
(49)
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pp. 10249-10256
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1999 ◽
Vol 5
(6)
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pp. 420-427
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