scholarly journals A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope

2021 ◽  
Vol 220 ◽  
pp. 113098
Author(s):  
Patrick Diehle ◽  
András Kovács ◽  
Thomas Duden ◽  
Rolf Speen ◽  
Kristina Žagar Soderžnik ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Tilt Angle ◽  
Magnetic Induction ◽  
Angle Measurement ◽  
Specimen Holder ◽  
Transmission Electron

An improved design for an Scanning Tunnelling Microscope (STM) for use in a Transmission Electron Microscope (TEM)

1991 ◽  
Vol 49 ◽  
pp. 384-385
Author(s):  
W.K. Lo ◽  
J.C.H. Spence
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Mechanical Stability ◽  
Scanning Tunnelling Microscope ◽  
Reflection Mode ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Scanning Tunnelling ◽  
Improved Design

An improved design for a combination Scanning Tunnelling Microscope/TEM specimen holder is presented. It is based on earlier versions which have been used to test the usefulness of such a device. As with the earlier versions, this holder is meant to replace the standard double-tilt specimen holder of an unmodified Philips 400T TEM. It allows the sample to be imaged simultaneously by both the STM and the TEM when the TEM is operated in the reflection mode (see figure 1).The resolution of a STM is determined by its tip radii as well as its stability. This places strict limitations on the mechanical stability of the tip with respect to the sample. In this STM the piezoelectric tube scanner is rigidly mounted inside the endcap of the STM holder. The tip coarse approach to the sample (z-direction) is provided by an Inchworm which is located outside the TEM vacuum.

An ultrahigh vacuum and ultrahigh resolution transmission electron microscope

1984 ◽  
Vol 42 ◽  
pp. 436-437
Author(s):  
M.L. McDonald ◽  
J.M. Gibson
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrahigh Vacuum ◽  
Pole Piece ◽  
Ultrahigh Resolution ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Sample Chamber ◽  
Point To Point

Interest in ultrahigh vacuum (UHV) specimen environments in the transmission electron microscope (TEM) has grown considerably in recent years. The possibility of in-situ studies of atomically clean surfaces has been demonstrated by Yagi et.al., Wilson & Petroff & others. Most designs have involved a side entry specimen holder with cryopumping in the pole piece and are not easily compatible with ultrahigh resolution(UHR) due to size and stability requirements. We have designed a differentially pumped UHV specimen chamber for the JEOL 200CX (UHRTEM). It is intended to allow examination of clean thin specimens at pressures below 10-9 torr with a point to point resolution of 2.5 Å. Provisions for in-situ heating, cooling & deposition have been made. A unique part of this design is the relatively large volume sample chamber held at UHV (figsl&2). This design allows characterization of the atmosphere to which the sample is exposed & cleaning & preparation of samples out of the pole piece which is believed to be necessary for UHRTEM. Another possibility with this design is the transfer of a sample into the TEM from other chambers by use of a transfer case without exposing the sample to an atmosphere above 10-9 torr. Extra ports have been provided to accommodate future experiments.

Structure and symmetry of CaFeTi2O6 perovskite

1995 ◽  
Vol 53 ◽  
pp. 364-365
Author(s):  
Nan Yao ◽  
Alexandra Navrotsky ◽  
Kurt Leinenweber
Keyword(s):  
Electron Microscope ◽  
Liquid Nitrogen ◽  
Transmission Electron Microscope ◽  
Point Group ◽  
Carbon Film ◽  
Group Symmetry ◽  
Point Group Symmetry ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Calcium Iron

A new calcium iron (II) titanate ordered perovskite (CaFeTi2O6) was recently synthesized from an equimolar mixture of CaTiO3 and FeTiO3 at 12-15 GPa and 1200-1400 °C. In the present paper, we discuss the structure and symmetry studies of this new compound CaFeTi2O6 using CBED and HREM techniques. The CaFeTi2O6 powder sample was crushed to small fragments with an agate mortar and pestle under purified methanol. A drop of the resulting suspension was placed on a copper grid coated with holey-carbon film. CBED and HREM studies were performed on a Philips-CM20 ST transmission electron microscope equipped with a double tilt, liquid-nitrogen-cooled specimen holder under moderate vacuum conditions over the range from 10-6-10-7 Torr. CBED makes it possible to examine the diffraction symmetry of key orientations of the crystal and therefore determine the point-group symmetry of the crystal. This information, along with the dynamic extinction information on systematic absences, can be used to determine the crystallographic space group uniquely.

scholarly journals Mapping the Magnetic Coupling of Self-Assembled Fe3O4 Nanocubes by Electron Holography

Materials ◽  
2021 ◽  
Vol 14 (4) ◽  
pp. 774 ◽  
Author(s):  
Lluís López-Conesa ◽  
Carlos Martínez-Boubeta ◽  
David Serantes ◽  
Sonia Estradé ◽  
Francesca Peiró
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Magnetic Induction ◽  
Theoretical Calculations ◽  
Magnetic Coupling ◽  
Magnetic Configuration ◽  
Electron Holography ◽  
Transmission Electron ◽  
Self Assembled ◽  
Good Agreement

The nanoscale magnetic configuration of self-assembled groups of magnetite 40 nm cubic nanoparticles has been investigated by means of electron holography in the transmission electron microscope (TEM). The arrangement of the cubes in the form of chains driven by the alignment of their dipoles of single nanocubes is assessed by the measured in-plane magnetic induction maps, in good agreement with theoretical calculations.

Use of an Energy Dispersive X-ray Spectrometer on a Transmission Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 60-61
Author(s):  
Roy H. Geiss ◽  
William A. Jesser
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Focal Length ◽  
Peak Height ◽  
Energy Dispersive ◽  
X Ray ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Specimen Height ◽  
Dispersive System

An Ortec Si(Li) energy dispersive X-ray detector designed for use on a Cambridge scanning electron microscope has been coupled to a Siemens transmission electron microscope by replacing the side tilt control on the Siemens by a brass tube as shown in figure 1. The Siemens specimen holder was modified to tilt the specimen approximately 20° from a horizontal position and to elevate it such that it is just visible to the detector through the side port. This increased specimen height requires an objective focal length of greater than 8 mm and consequently effects a lower resolution of the image, especially at low accelerating voltages. The peak/background in the X-ray spectra is best at 40kV, however, and deteriorates progressively with increasing accelerating voltage.Experiments similar to those of Fuchs, who employed a wavelength dispersive system on a Siemens TEM to measure film thickness, were repeated with the present energy dispersive system by analysing spectra from vacuum deposited gold films of various thicknesses. A linear relation between peak height and thickness was confirmed for several films up to 2000Å thick by comparing spectra from two adjacent grid squares, one covered by a single thickness of gold, the other covered by a double thickness, and noting that the peak heights were in the ratio of 1:2 to within a few percent.

A FIB Micro-Sampling Technique and a Site-Specific TEM Specimen Preparation Method for Precision Materials Characterization

2000 ◽  
Vol 636 ◽  
Author(s):  
Toshie Yaguchi ◽  
Ryoichi Urao ◽  
Takeo Kamino ◽  
Tsuyoshi Ohnishi ◽  
Takahito Hashimoto ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ion Beam ◽  
Thin Foil ◽  
Specimen Preparation ◽  
Deep Trench ◽  
Site Specific ◽  
Area Of Interest ◽  
Specimen Holder ◽  
Transmission Electron

AbstractA technique to cut out small pieces of samples directly from chips or wafer samples in a focused ion beam (FIB) system has been developed. A deep trench is FIB milled to cut out a small, wedge-shaped portion of the sample from the area of interest A micromanipulator with tungsten (W) probe is employed for lifting the micro-sample. The lifted micro-sample is then mounted on a carrier to prepare electron transparent thin foil specimens for transmission electron microscope (TEM) observation. We have also developed a method for site-specific TEM specimen preparation. In this method, FIB system and TEM/scanning transmission electron microscope (STEM) equipped with secondary electron (SE) detector are employed. An FIB–TEM/STEM compatible specimen holder has also been developed so that a specimen can be milled in the FIB system and observed in a TEM/STEM without remounting the specimen. STEM and scanning electron microscopy (SEM) images are used for locating a specific site on a specimen. SEM image observation at an accelerating voltage of 200kV enabled us to observe not only surface structures but also inner structures near the surface of a cross section with depth of field of around 1 micrometer. The STEM image allows the observation of inner structures of 3-5 micrometer thick specimens. Milling of a specimen by FIB and observation of the milled sample by SEM and STEM are alternately carried out until an electron transparent thin foil specimen is obtained. The position accuracy of the method in TEM specimen preparation is approximately 100nm.

Development of tomography–transmission electron microscope (TEM) specimen holder stable under acoustic disturbances

2021 ◽  
pp. 1351010X2198949
Author(s):  
Khaled Bataineh
Keyword(s):  
Finite Element ◽  
Electron Microscope ◽  
Viscoelastic Material ◽  
Transmission Electron Microscope ◽  
Air Pressure ◽  
Atomic Resolution ◽  
Shell Layer ◽  
Acoustic Disturbances ◽  
Specimen Holder ◽  
Transmission Electron

This paper focuses on the development of tomography—transmission electron microscope (TEM) specimen holder stable under environment effect that allows atomic resolution. The successful holder must be dynamically stable for accuracy and image processes to obtain an atomic resolution, with a minimum controllable drift of the sample position. Different strategies to reduce the effect of acoustic disturbances are investigated. The approach to the problem has been two-fold, numerical and experimental. The effect of mechanical and acoustic noise is analyzed. Finite element results match very well previous experimental results and observations. Theoretical analysis showed that air pressure fluctuations have a significant impact on microscopes with side entry goniometers, especially when the exciting frequency matches a vibration mode of the sample holder. For example, finite element analysis (FEA) predicts that the tip deflections are 4.5 Å and 0.09 Å under air pressure excitation of 64 and 40 dB respectively. Utilizing a sandwiched constrained damping shell layer made of viscoelastic material that partially covers the inner part of TEM holder body successfully decreased the vibration. Finite element simulations predict that a shell layer of viscoelastic material with a thickness equal to the 1/10 of the body holder diameter reduces the vibrations by 30%. The viscoelastic layer shell thickness, loss factor, and elastic modulus have a strong effect on the damping behavior and the optimal combination should be determined.

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