Low temperature annealing effects on the structure and optical properties of ZnO films grown by pulsed laser deposition

Vacuum ◽  
2010 ◽  
Vol 84 (11) ◽  
pp. 1280-1286 ◽  
Author(s):  
B.L. Zhu ◽  
X.Z. Zhao ◽  
F.H. Su ◽  
G.H. Li ◽  
X.G. Wu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Low Temperature ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Zno Films ◽  
Low Temperature Annealing ◽  
Annealing Effects

Study of structural and optical properties of ZnO films grown by pulsed laser deposition

2010 ◽  
Vol 256 (18) ◽  
pp. 5650-5655 ◽  
Author(s):  
S. Lemlikchi ◽  
S. Abdelli-Messaci ◽  
S. Lafane ◽  
T. Kerdja ◽  
A. Guittoum ◽  
...  
Keyword(s):  
Optical Properties ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Zno Films ◽  
Structural And Optical Properties

Low-temperature growth of epitaxial ZnO films on (001) sapphire by ultraviolet- assisted pulsed laser deposition

1999 ◽  
Vol 69 (7) ◽  
pp. S531-S533 ◽  
Author(s):  
V. Craciun ◽  
J. Perriere ◽  
N. Bassim ◽  
R.K. Singh ◽  
D. Craciun ◽  
...  
Keyword(s):  
Low Temperature ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Zno Films ◽  
Temperature Growth ◽  
Low Temperature Growth

Optical properties of antimony-doped p-type ZnO films fabricated by pulsed laser deposition

2009 ◽  
Vol 105 (11) ◽  
pp. 113516 ◽  
Author(s):  
X. H. Pan ◽  
W. Guo ◽  
Z. Z. Ye ◽  
B. Liu ◽  
Y. Che ◽  
...  
Keyword(s):  
Optical Properties ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Zno Films ◽  
P Type

Effects of misfit strain on properties of ZnO films grown by pulsed laser deposition

2001 ◽  
Vol 696 ◽  
Author(s):  
M.C. Park ◽  
W.H. Yoon ◽  
D.H. Lee ◽  
J.M. Myoung ◽  
S.H. Bae ◽  
...  
Keyword(s):  
Optical Properties ◽  
Film Thickness ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Xrd Analysis ◽  
Misfit Strain ◽  
Laser Deposition ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Electrical And Optical Properties

AbstractA series of ZnO films with various thicknesses were prepared on (0001) sapphire substrate by pulsed laser deposition (PLD). Scanning electron microscopy (SEM) and x-ray diffraction (XRD) analysis were utilized to investigate the effects of misfit strain on the surface morphology and the crystallinity. The electrical and optical properties of the films were also investigated as a function of the film thickness. It was found that the crystalline quality, electrical and optical properties of the films depended on the film thickness and were improved with increasing the film thickness. This is attributed to the fact that the films thinner than 400 nm are under the severe misfit strain, which decreases as the film thickness increases further.

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