Tribological properties of a tetrahedral amorphous carbon (ta-C) film under boundary lubrication in the presence of organic friction modifiers and zinc dialkyldithiophosphate (ZDDP)

Wear ◽  
2015 ◽  
Vol 332-333 ◽  
pp. 1293-1302 ◽  
Author(s):  
Hikaru Okubo ◽  
Chiharu Tadokoro ◽  
Shinya Sasaki
Keyword(s):  
Amorphous Carbon ◽  
Tribological Properties ◽  
Boundary Lubrication ◽  
Zinc Dialkyldithiophosphate ◽  
Friction Modifiers ◽  
Tetrahedral Amorphous Carbon

Thin coatings with tetrahedral amorphous carbon structure and their behavior in boundary lubrication conditions

2020 ◽  
pp. 506-511
Author(s):  
V.D. Samusenko ◽  
I.A. Zavidovskii ◽  
O.A. Streletskii ◽  
I.A. Buyanovskii ◽  
M.M. Khrushchov ◽  
...  
Keyword(s):  
Amorphous Carbon ◽  
Boundary Lubrication ◽  
Carbon Structure ◽  
Thin Coatings ◽  
Tribological Tests ◽  
Tetrahedral Amorphous Carbon ◽  
Structural Peculiarities ◽  
Lubrication Conditions

The results of an investigation of the structural peculiarities of the thin ta-C coatings obtained by the method of impulse arc sputtering of graphite and of their tribological tests in boundary lubrication conditions are presented.

Structure and Tribological Properties of Ultra-Thin Tetrahedral Amorphous Carbon (ta-C) Films

Tribology ◽  
2006 ◽  
Author(s):  
Xinchun Lu ◽  
Hui Wang ◽  
Chenhui Zhang ◽  
Jianbin Luo
Keyword(s):  
Amorphous Carbon ◽  
Tribological Properties ◽  
Electron Spectroscopy ◽  
Vacuum Arc ◽  
Wear Properties ◽  
Force Microscopy ◽  
Tetrahedral Amorphous Carbon ◽  
Atomic Force ◽  
Transmission Electron ◽  
Filtered Cathodic Vacuum Arc

Ultra-thin tetrahedral amorphous carbon (ta-C) films were deposited by the filtered cathodic vacuum arc (FCVA) technique. The thickness, structure, and topography of the films were studied by various analysis methods, such as auger electron spectroscopy (AES) depth profile, high resolution transmission electron microscope (HRTEM), Raman spectroscopy, and atomic force microscopy (AFM). A tribometer was used to investigate the tribological properties of the ta-C films. The results indicate that ta-C film with thickness less than 2 nm can be obtained by the FCVA technique. As the film thickness increases the relative intensity ratio ID/IG decreases, which means that sp3 bond in the films increases. The oxide layer cleaning procedure of silicon substrate before deposition influences the growth mode and surface roughness of the films. The ultra-thin ta-C film has the lowest friction coefficient of 0.19 and excellent anti-wear properties.

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