Characterization of inner surface phenomena in capillary electrophoresis capillaries by electron microscopy, atomic force microscopy and secondary ion mass spectroscopy

Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

Thin Solid Films ◽

10.1016/s0040-6090(98)00453-2 ◽

1998 ◽

Vol 321 (1-2) ◽

pp. 86-91 ◽

Cited By ~ 14

Author(s):

G Wöhl ◽

C Schöllhorn ◽

O.G Schmidt ◽

K Brunner ◽

K Eberl ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Self Assembled

Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation

Microscopy and Microanalysis ◽

10.1017/s1431927620024678 ◽

2020 ◽

pp. 1-9

Author(s):

Lex Pillatsch ◽

Szilvia Kalácska ◽

Xavier Maeder ◽

Johann Michler

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Mass Spectroscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Force Microscopy ◽

Atomic Force ◽

Secondary Ion

Abstract

Atomic force microscopy, scanning electron microscopy and electrochemical characterization of Al alloys, conversion coatings, and primers used for aircraft

Progress in Organic Coatings ◽

10.1016/s0300-9440(97)00097-0 ◽

1997 ◽

Vol 32 (1-4) ◽

pp. 25-30 ◽

Cited By ~ 27

Author(s):

G.P Bierwagen ◽

Rebecca Twite ◽

G Chen ◽

D.E Tallman

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Al Alloys ◽

Electrochemical Characterization ◽

Conversion Coatings ◽

Force Microscopy ◽

Atomic Force ◽

Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization

Applied Surface Science ◽

10.1016/j.apsusc.2005.09.076 ◽

2006 ◽

Vol 252 (18) ◽

pp. 6353-6359 ◽

Cited By ~ 5

Author(s):

M. Esmaeelpour ◽

G. Kavei

Keyword(s):

Atomic Force Microscopy ◽

Mass Spectroscopy ◽

Nitrogen Ion Implantation ◽

Force Microscopy ◽

Atomic Force ◽

Diffusion Phenomena ◽

Thin Chromium ◽

Nitrogen Ion ◽

And Diffusion ◽

Secondary Ion

3-D morphological characterization of the liver parenchyma by atomic force microscopy and by scanning electron microscopy

Microscopy Research and Technique ◽

10.1002/jemt.20045 ◽

2004 ◽

Vol 64 (1) ◽

pp. 1-9 ◽

Cited By ~ 10

Author(s):

Mahmoud Melling ◽

Daniela Karimian-Teherani ◽

Sascha Mostler ◽

Mark Behnam ◽

Sonja Hochmeister

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Liver Parenchyma ◽

Morphological Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Fused-silica capillaries for capillary electrophoresis and gas chromatography: Inner surface corrosion, within-batch differences, and influence of drawing parameters studied by atomic force microscopy

Electrophoresis ◽

10.1002/(sici)1522-2683(19990801)20:12<2566::aid-elps2566>3.0.co;2-c ◽

1999 ◽

Vol 20 (12) ◽

pp. 2566-2574 ◽

Cited By ~ 18

Author(s):

Stefan Kaupp ◽

Hermann Wätzig

Keyword(s):

Gas Chromatography ◽

Atomic Force Microscopy ◽

Capillary Electrophoresis ◽

Fused Silica ◽

Force Microscopy ◽

Surface Corrosion ◽

Atomic Force ◽

Fused Silica Capillaries ◽

Silica Capillaries ◽

Inner Surface

Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

Philosophical Magazine A ◽

10.1080/01418610208240053 ◽

2002 ◽

Vol 82 (13) ◽

pp. 2575-2589 ◽

Cited By ~ 6

Author(s):

B. Fruhstorfer ◽

V. Mohles ◽

R. Reichelt ◽

E. Nembach

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Second Phase ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Second Phase Particles ◽

Characterization of Polymeric Particles with Electron Microscopy, Dynamic Light Scattering, and Atomic Force Microscopy

Particulate Science And Technology ◽

10.1080/02726351.2010.504133 ◽

2010 ◽

Vol 28 (5) ◽

pp. 472-484 ◽

Cited By ~ 6

Author(s):

Betina Giehl Zanetti-Ramos ◽

Mauricia Beddin Fritzen-Garcia ◽

Tânia Beatriz Creczynski-Pasa ◽

Cristian Schweitzer De Oliveira ◽

André Avelino Pasa ◽

...

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Light Scattering ◽

Dynamic Light Scattering ◽

Force Microscopy ◽

Atomic Force ◽

Polymeric Particles

Characterization of Polyelectrolyte−Protein Multilayer Films by Atomic Force Microscopy, Scanning Electron Microscopy, and Fourier Transform Infrared Reflection−Absorption Spectroscopy

Langmuir ◽

10.1021/la971288h ◽

1998 ◽

Vol 14 (16) ◽

pp. 4559-4565 ◽

Cited By ~ 210

Author(s):

Frank Caruso ◽

D. Neil Furlong ◽

Katsuhiko Ariga ◽

Izumi Ichinose ◽

Toyoki Kunitake

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Multilayer Films ◽

Force Microscopy ◽

Infrared Reflection Absorption Spectroscopy ◽

Atomic Force ◽

Infrared Reflection ◽