Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization

In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation

Microscopy and Microanalysis ◽

10.1017/s1431927620024678 ◽

2020 ◽

pp. 1-9

Author(s):

Lex Pillatsch ◽

Szilvia Kalácska ◽

Xavier Maeder ◽

Johann Michler

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Mass Spectroscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Force Microscopy ◽

Atomic Force ◽

Abstract

Characterization of inner surface phenomena in capillary electrophoresis capillaries by electron microscopy, atomic force microscopy and secondary ion mass spectroscopy

Journal of Chromatography A ◽

10.1016/s0021-9673(97)00636-5 ◽

1997 ◽

Vol 781 (1-2) ◽

pp. 55-65 ◽

Cited By ~ 20

Author(s):

Stefan Kaupp ◽

Hermann Wätzig

Keyword(s):

Electron Microscopy ◽

Atomic Force Microscopy ◽

Capillary Electrophoresis ◽

Mass Spectroscopy ◽

Surface Phenomena ◽

Force Microscopy ◽

Atomic Force ◽

Inner Surface ◽

Cover Picture: Molecular Organization of Various Collagen Fragments as Revealed by Atomic Force Microscopy and Diffusion-Ordered NMR Spectroscopy (ChemPhysChem 13/2012)

ChemPhysChem ◽

10.1002/cphc.201290060 ◽

2012 ◽

Vol 13 (13) ◽

pp. 3065-3065

Author(s):

Sabine Stötzel ◽

Marloes Schurink ◽

Hans Wienk ◽

Uschi Siebler ◽

Monika Burg-Roderfeld ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Nmr Spectroscopy ◽

Molecular Organization ◽

Force Microscopy ◽

Atomic Force ◽

And Diffusion

A combination of atomic force microscopy and secondary ion mass spectrometry for investigation of AlxGa1?xAs/GaAs superlattices

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00325813 ◽

1993 ◽

Vol 345 (8-9) ◽

pp. 615-617 ◽

Cited By ~ 6

Author(s):

G. Friedbacher ◽

D. Schwarzbach ◽

P. K. Hansma ◽

H. Nickel ◽

M. Grasserbauer ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Extension-Dependent Drift Velocity and Diffusion (DrDiff) Directly Reconstructs the Folding Free Energy Landscape of Atomic Force Microscopy Experiments

The Journal of Physical Chemistry Letters ◽

10.1021/acs.jpclett.9b02146 ◽

2020 ◽

Vol 11 (3) ◽

pp. 800-807

Author(s):

Frederico Campos Freitas ◽

Ronaldo Junio de Oliveira

Keyword(s):

Atomic Force Microscopy ◽

Free Energy ◽

Drift Velocity ◽

Energy Landscape ◽

Free Energy Landscape ◽

Force Microscopy ◽

Atomic Force ◽

And Diffusion ◽

Folding Free Energy

Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis

Langmuir ◽

10.1021/la703741y ◽

2008 ◽

Vol 24 (7) ◽

pp. 2955-2959 ◽

Cited By ~ 29

Author(s):

Etienne Dague ◽

Arnaud Delcorte ◽

Jean-Paul Latgé ◽

Yves F. Dufrêne

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Cell Surface ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Combined Use ◽

Lateral Heterogeneity of Dipalmitoylphosphatidylethanolamine−Cholesterol Langmuir−Blodgett Films Investigated with Imaging Time-of-Flight Secondary Ion Mass Spectrometry and Atomic Force Microscopy

Langmuir ◽

10.1021/la0479455 ◽

2005 ◽

Vol 21 (3) ◽

pp. 807-813 ◽

Cited By ~ 32

Author(s):

Carolyn M. McQuaw ◽

Audra G. Sostarecz ◽

Leiliang Zheng ◽

Andrew G. Ewing ◽

Nicholas Winograd

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Time Of Flight ◽

Lateral Heterogeneity ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films ◽

Surface characteristics of glass fibres covered with an aluminum layer after a chemical modification process using secondary ion mass spectrometry (SIMS) and atomic force microscopy (AFM)

International Journal of Mass Spectrometry ◽

10.1016/j.ijms.2009.06.009 ◽

2009 ◽

Vol 286 (1) ◽

pp. 11-16 ◽

Cited By ~ 3

Author(s):

Katarzyna Kupiec ◽

Piotr Konarski ◽

Piotr Konieczka ◽

Jacek Namieśnik

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Chemical Modification ◽

Surface Characteristics ◽

Aluminum Layer ◽

Force Microscopy ◽

Atomic Force ◽

Modification Process ◽

Molecular Organization of Various Collagen Fragments as Revealed by Atomic Force Microscopy and Diffusion-Ordered NMR Spectroscopy

ChemPhysChem ◽

10.1002/cphc.201200284 ◽

2012 ◽

Vol 13 (13) ◽

pp. 3117-3125 ◽

Cited By ~ 9

Author(s):

Sabine Stötzel ◽

Marloes Schurink ◽

Hans Wienk ◽

Uschi Siebler ◽

Monika Burg-Roderfeld ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Nmr Spectroscopy ◽

Molecular Organization ◽

Force Microscopy ◽

Atomic Force ◽

And Diffusion

Surface Properties of Poly(3-hydroxybutyrate-co-3- hydroxyvalerate) Banded Spherulites Studied by Atomic Force Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir ◽

10.1021/la034865c ◽

2003 ◽

Vol 19 (18) ◽

pp. 7417-7422 ◽

Cited By ~ 27

Author(s):

Yong Jiang ◽

Jian-Jun Zhou ◽

Lin Li ◽

Jun Xu ◽

Bao-Hua Guo ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Surface Properties ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Banded Spherulites ◽