Atomic scale characterization of GaInN/GaN layers grown on sapphire substrates with low-temperature deposited AlN buffer layers
2002 ◽
Vol 237-239
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pp. 1133-1138
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Keyword(s):
2005 ◽
Vol 23
(4)
◽
pp. 1684
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1998 ◽
Vol 189-190
◽
pp. 282-286
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1998 ◽
Vol 37
(Part 2, No. 8A)
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pp. L905-L906
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Keyword(s):
Keyword(s):
2016 ◽
Vol 33
(7)
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pp. 419-437
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2012 ◽
Vol 14
(44)
◽
pp. 15593
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1997 ◽
Vol 15
(4)
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pp. 1187
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