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Observation of different reflected high-energy electron diffraction patterns during atomic layer epitaxy growth of CdTe epilayers
Journal of Crystal Growth
◽
10.1016/0022-0248(91)90829-t
◽
1991
◽
Vol 115
(1-4)
◽
pp. 692-697
◽
Cited By ~ 18
Author(s):
W. Faschinger
◽
P. Juza
◽
H. Sitter
Keyword(s):
Electron Diffraction
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
◽
Diffraction Patterns
Download Full-text
Related Documents
Cited By
References
Direct observation of GaAs atomic layer epitaxy by reflection high‐energy electron diffraction
Applied Physics Letters
◽
10.1063/1.101666
◽
1989
◽
Vol 55
(12)
◽
pp. 1244-1246
◽
Cited By ~ 33
Author(s):
T. H. Chiu
Keyword(s):
Electron Diffraction
◽
Direct Observation
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
Download Full-text
Atomic‐layer epitaxy by a flux‐interruption and annealing method and the analysis of reflection high‐energy electron diffraction oscillation overshoot in the molecular‐beam epitaxy growth of GaAs
Journal of Applied Physics
◽
10.1063/1.352976
◽
1993
◽
Vol 73
(7)
◽
pp. 3291-3294
◽
Cited By ~ 4
Author(s):
Kun‐jing Lee
◽
Joseph Ya‐min Lee
◽
Yu‐jeng Chang
Keyword(s):
Molecular Beam Epitaxy
◽
Electron Diffraction
◽
Molecular Beam
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
Molecular Beam Epitaxy Growth
◽
High Energy Electron
◽
Annealing Method
Download Full-text
Reflection High-Energy Electron Diffraction of Heteroepitaxy in Chemical Vapor Deposition Reactor: Atomic-Layer Epitaxy of GaAs, AlAs and GaP on Si
Japanese Journal of Applied Physics
◽
10.1143/jjap.32.1051
◽
1993
◽
Vol 32
(Part 1, No. 3A)
◽
pp. 1051-1055
◽
Cited By ~ 8
Author(s):
Kuninori Kitahara
◽
Masashi Ozeki
◽
Kazuo Nakajima
Keyword(s):
Chemical Vapor Deposition
◽
Electron Diffraction
◽
Vapor Deposition
◽
Chemical Vapor
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
◽
Chemical Vapor Deposition Reactor
Download Full-text
Surface stoichiometry determination using reflection high-energy electron diffraction and atomic-layer epitaxy: The case of ZnTe(100)
Physical Review B
◽
10.1103/physrevb.52.7822
◽
1995
◽
Vol 52
(11)
◽
pp. 7822-7825
◽
Cited By ~ 28
Author(s):
B. Daudin
◽
S. Tatarenko
◽
D. Brun-Le Cunff
Keyword(s):
Electron Diffraction
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
Download Full-text
Real‐time study of the reflection high energy electron diffraction specular beam intensity during atomic layer epitaxy of GaAs
Applied Physics Letters
◽
10.1063/1.109293
◽
1993
◽
Vol 62
(20)
◽
pp. 2551-2553
◽
Cited By ~ 3
Author(s):
B. Y. Maa
◽
P. D. Dapkus
◽
P. Chen
◽
A. Madhukar
Keyword(s):
Electron Diffraction
◽
Real Time
◽
Atomic Layer
◽
High Energy
◽
Beam Intensity
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
Time Study
◽
High Energy Electron
Download Full-text
Atomic layer epitaxy processes of ZnSe on GaAs(001) as observed by beam-rocking reflection high-energy electron diffraction (RHEED) and total-reflection-angle X-ray spectroscopy (TRAXS)
Journal of Crystal Growth
◽
10.1016/s0022-0248(98)01383-9
◽
1999
◽
Vol 201-202
◽
pp. 490-493
◽
Cited By ~ 5
Author(s):
Akihiro Ohtake
◽
Takashi Hanada
◽
Kenta Arai
◽
Takuji Komura
◽
Shiro Miwa
◽
...
Keyword(s):
Electron Diffraction
◽
Atomic Layer
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
Dynamic Reflection High-Energy Electron Diffraction Observations of the Atomic Layer Epitaxy Growth of Zn Chaleogenides
Japanese Journal of Applied Physics
◽
10.1143/jjap.25.l942
◽
1986
◽
Vol 25
(Part 2, No. 12)
◽
pp. L942-L944
◽
Cited By ~ 14
Author(s):
Takafumi Yao
Keyword(s):
Electron Diffraction
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
◽
Dynamic Reflection
Download Full-text
Comparative analysis of high energy electron diffraction patterns from LB films of Cd- and Pb-stearates
Thin Solid Films
◽
10.1016/s0040-6090(95)08307-3
◽
1996
◽
Vol 284-285
◽
pp. 208-210
◽
Cited By ~ 7
Author(s):
V. Klechkovskaya
◽
M. Anderle
◽
R. Antolini
◽
R. Canteri
◽
L. Feigin
◽
...
Keyword(s):
Comparative Analysis
◽
Electron Diffraction
◽
High Energy
◽
Energy Electron
◽
High Energy Electron
◽
Lb Films
◽
Diffraction Patterns
Download Full-text
Atomic layer controlled doping by reflection high‐energy electron diffraction during epitaxial growth
Journal of Applied Physics
◽
10.1063/1.351036
◽
1992
◽
Vol 71
(6)
◽
pp. 2650-2654
◽
Cited By ~ 1
Author(s):
Ziqiang Zhu
◽
Mitsuo Kawashima
◽
Takafumi Yao
Keyword(s):
Electron Diffraction
◽
Epitaxial Growth
◽
Atomic Layer
◽
High Energy
◽
Energy Electron
◽
High Energy Electron
◽
Controlled Doping
Download Full-text
Structural Analysis of the Si(111)√21 × √21-(Ag,Au) Surface by Reflection High-Energy Electron Diffraction Patterns
e-Journal of Surface Science and Nanotechnology
◽
10.1380/ejssnt.2008.84
◽
2008
◽
Vol 6
(0)
◽
pp. 84-86
Author(s):
Nozomi Kido
◽
Ayahiko Ichimiya
Keyword(s):
Structural Analysis
◽
Electron Diffraction
◽
High Energy
◽
Energy Electron
◽
High Energy Electron
◽
Diffraction Patterns
Download Full-text
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