Surface structure of Kevlar® fiber studied by atomic force microscopy and inverse gas chromatography

Polymer ◽  
1999 ◽  
Vol 40 (26) ◽  
pp. 7341-7350 ◽  
Author(s):  
S Rebouillat ◽  
J.C.M Peng ◽  
J.-B Donnet
Keyword(s):  
Gas Chromatography ◽  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Inverse Gas Chromatography ◽  
Force Microscopy ◽  
Atomic Force

Image enhancement of polyethersulfone ultrafiltration membrane surface structure for atomic force microscopy

1992 ◽  
Vol 46 (1) ◽  
pp. 167-178 ◽  
Author(s):  
A. K. Fritzsche ◽  
A. R. Arevalo ◽  
M. D. Moore ◽  
C. J. Weber ◽  
V. B. Elings ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Image Enhancement ◽  
Membrane Surface ◽  
Ultrafiltration Membrane ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Surface structure of polymers and their model compounds observed by atomic force microscopy

1992 ◽  
Vol 42-44 ◽  
pp. 1141-1147 ◽  
Author(s):  
W. Stocker ◽  
B. Bickmann ◽  
S.N. Magonov ◽  
H.-J. Cantow ◽  
B. Lotz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Model Compounds ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Топография поверхности и оптические характеристики тонких пленок AlN на подложке GaAs (100), полученных методом реактивного ионно-плазменного распыления

2019 ◽  
Vol 45 (5) ◽  
pp. 38
Author(s):  
Е.В. Фомин ◽  
А.Д. Бондарев ◽  
A.I. Rumyantseva ◽  
T. Maurer ◽  
Н.А. Пихтин ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Refractive Index ◽  
Surface Structure ◽  
Optical Characteristics ◽  
Process Conditions ◽  
Antireflection Coatings ◽  
Force Microscopy ◽  
Plasma Sputtering ◽  
Atomic Force ◽  
Ion Plasma

AbstractA study of the surface topography and optical characteristics of thin AlN films used as passivating and antireflection coatings deposited on n -GaAs (100) substrates by reactive ion-plasma sputtering is reported. It was found that the process conditions affect the structure and the optical characteristics of the films, which makes it possible to obtain coatings with prescribed parameters. An analysis of the results furnished by ellipsometry and atomic-force microscopy of the surface shows that the refractive index of the films is correlated with the surface structure.

Molecular Architecture of Natural Polysaccharide Based Thin Films

2016 ◽  
Vol 258 ◽  
pp. 358-361 ◽  
Author(s):  
Yuliya V. Chudinova ◽  
Denis V. Kurek ◽  
Valery P. Varlamov
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Molecular Architecture ◽  
Nanostructured Films ◽  
Thin Coatings ◽  
Force Microscopy ◽  
Atomic Force ◽  
Natural Polysaccharide

Natural biodegradable and biocompatible polysaccharides chitosan, pectin, carrageenan and heparin were used to form thin nanostructured films. In this study using atomic force microscopy (AFM) and force spectroscopy the special characteristics of formation and structure of thin coatings were investigated, three models of the polymers interaction were proposed. Different mechanisms of polymers influence on each other in the bilayers formation were shown, coatings with different surface structure and mechanical properties were formed. The obtained data can be used for the preparation of nanostructured coatings with desired surface parameters.

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