Soft breakdown current noise in ultra-thin gate oxides
2002 ◽
Vol 46
(7)
◽
pp. 1019-1025
◽
2002 ◽
Vol 42
(4-5)
◽
pp. 565-571
◽
Keyword(s):
2002 ◽
Vol 41
(Part 1, No. 4B)
◽
pp. 2426-2430
◽
Keyword(s):