Analysis of direct tunneling for thin SiO2 film by Wentzel, Kramers, Brillouin method––considering tail of distribution function
2003 ◽
Vol 47
(1)
◽
pp. 161-163
◽
2002 ◽
Vol 46
(4)
◽
pp. 577-579
◽
1998 ◽
Keyword(s):
1997 ◽
Vol 7
(C2)
◽
pp. C2-261-C2-262
◽
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-67-Pr3-70
1977 ◽
Vol 38
(C2)
◽
pp. C2-185-C2-190
◽
2006 ◽
Vol 2006
(suppl_23_2006)
◽
pp. 175-180