Surface observation of Mo nanocrystals deposited on Si (111) thin films by a newly developed ultrahigh vacuum field-emission transmission electron microscope

1998 ◽  
Vol 319 (1-2) ◽  
pp. 110-114 ◽  
Author(s):  
Miyoko Tanaka ◽  
Kazuo Furuya ◽  
Masaki Takeguchi ◽  
Toshikazu Honda
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Ultrahigh Vacuum ◽  
Vacuum Field ◽  
Surface Observation ◽  
Transmission Electron

Formation mechanism of Sn-patch between SnAgCu solder and Ti/Ni(V)/Cu under bump metallization

2009 ◽  
Vol 24 (8) ◽  
pp. 2638-2643 ◽  
Author(s):  
Kai-Jheng Wang ◽  
Yan-Zuo Tsai ◽  
Jenq-Gong Duh ◽  
Toung-Yi Shih
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Formation Mechanism ◽  
Transmission Electron Microscope ◽  
Electron Probe ◽  
Under Bump Metallization ◽  
Rich Phase ◽  
Snagcu Solder ◽  
Electron Probe Microanalyzer ◽  
Transmission Electron

An Sn-patch formed in Ni(V)-based under bump metallization during reflow and aging. To elucidate the evolution of the Sn-patch, the detailed compositions and microstructure in Sn–Ag–Cu and Ti/Ni(V)/Cu joints were analyzed by a field emission electron probe microanalyzer (EPMA) and transmission electron microscope (TEM), respectively. There existed a concentration redistribution in the Sn-patch, and its microstructure also varied with aging. The Sn-patch consisted of crystalline Ni and an amorphous Sn-rich phase after reflow, whereas V2Sn3 formed with amorphous an Sn-rich phase during aging. A possible formation mechanism of the Sn-patch was proposed.

Crystal Structures on Growth of Pr0.7Ca0.3MnO3 Thin Films Analyzed by Transmission Electron Microscope

2007 ◽  
Vol 51 (12) ◽  
pp. 147 ◽  
Author(s):  
H. B. MOON ◽  
C. H. KIM ◽  
S. S. MIN ◽  
J. H. CHO ◽  
Y. K. KIM ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Crystal Structures ◽  
Transmission Electron Microscope ◽  
Transmission Electron
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