Formation mechanism of Sn-patch between SnAgCu solder and Ti/Ni(V)/Cu under bump metallization

2009 ◽  
Vol 24 (8) ◽  
pp. 2638-2643 ◽  
Author(s):  
Kai-Jheng Wang ◽  
Yan-Zuo Tsai ◽  
Jenq-Gong Duh ◽  
Toung-Yi Shih
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Formation Mechanism ◽  
Transmission Electron Microscope ◽  
Electron Probe ◽  
Under Bump Metallization ◽  
Rich Phase ◽  
Snagcu Solder ◽  
Electron Probe Microanalyzer ◽  
Transmission Electron

An Sn-patch formed in Ni(V)-based under bump metallization during reflow and aging. To elucidate the evolution of the Sn-patch, the detailed compositions and microstructure in Sn–Ag–Cu and Ti/Ni(V)/Cu joints were analyzed by a field emission electron probe microanalyzer (EPMA) and transmission electron microscope (TEM), respectively. There existed a concentration redistribution in the Sn-patch, and its microstructure also varied with aging. The Sn-patch consisted of crystalline Ni and an amorphous Sn-rich phase after reflow, whereas V2Sn3 formed with amorphous an Sn-rich phase during aging. A possible formation mechanism of the Sn-patch was proposed.

Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

Microscopy ◽  
2020 ◽  
Vol 69 (6) ◽  
pp. 411-416
Author(s):  
Tetsuya Akashi ◽  
Yoshio Takahashi ◽  
Ken Harada
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Beam Splitters ◽  
Interference Fringes ◽  
Transmission Electron ◽  
Performance Results

Abstract We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.

Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscope

2019 ◽  
Vol 202 ◽  
pp. 107-113 ◽  
Author(s):  
Takeshi Kawasaki ◽  
Tetsuya Akashi ◽  
Keigo Kasuya ◽  
Hiroyuki Shinada
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Transmission Electron

Microstructure Characteristics of the Black-Glazed Shreds Excavated from the Qingliangsi Kiln

2011 ◽  
Vol 492 ◽  
pp. 112-117 ◽  
Author(s):  
Zi Wei Liu ◽  
Zhi Gang Zhang ◽  
Hua Li ◽  
Wei Wu ◽  
Jia Jie Hua ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Iron Oxide ◽  
Field Emission ◽  
Electron Probe ◽  
Zone Axis ◽  
Microstructure Characteristics ◽  
Transmission Electron ◽  
Oxide Crystal ◽  
Crystal Phases ◽  
Micro Structures

The black-glazed shreds from Qingliangsi kiln were studied. The glaze and body micro- structures, compositions and crystal phases were observed and analyzed by field emission scanning electron, microscope multiple functions electron probe-energy spectrum instrument and field emission transmission electron microscope. The iron oxide crystal in oil spot was mainly the ε-Fe2O3 in the orientation of the zone axis [001], and also few content of ε-Fe2O3 in the orientation of the zone axis [412]. The brown oil spots on the glaze surface were aggregations of a great deal of iron oxide hematite crystals. Bodies of black-glazed shreds have high Al2O3(26.47 % ~ 30.48%) and low SiO2 (62.77% ~ 66.20%), which pertained to the typical recipe of north porcelain bodies. The glaze are attributed to calcium-alkali glaze, and according to the ratio of Al2O3:SiO2, it belongs to the crystallization glaze.

scholarly journals Development of Pulse Magnetization System on Aberration Corrected 1.2-MV Cold Field-Emission Transmission Electron Microscope

2016 ◽  
Vol 22 (S3) ◽  
pp. 1702-1703 ◽  
Author(s):  
Toshiaki Tanigaki ◽  
Tetsuya Akashi ◽  
Akira Sugawara ◽  
Kodai Niitsu ◽  
Xiuzhen Yu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Pulse Magnetization ◽  
Transmission Electron ◽  
Aberration Corrected
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