A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and
Visualization of Topological Quantum Phenomena

An Sn-patch formed in Ni(V)-based under bump metallization during reflow and aging. To elucidate the evolution of the Sn-patch, the detailed compositions and microstructure in Sn–Ag–Cu and Ti/Ni(V)/Cu joints were analyzed by a field emission electron probe microanalyzer (EPMA) and transmission electron microscope (TEM), respectively. There existed a concentration redistribution in the Sn-patch, and its microstructure also varied with aging. The Sn-patch consisted of crystalline Ni and an amorphous Sn-rich phase after reflow, whereas V2Sn3 formed with amorphous an Sn-rich phase during aging. A possible formation mechanism of the Sn-patch was proposed.

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Progress in Electron Energy Loss Spectroscopic Imaging and Analysing Biological Specimens with a Field Emission Scanning Transmission Electron Microscope

Electron Probe Microanalysis - Springer Series in Biophysics ◽

10.1007/978-3-642-74477-8_8 ◽

1989 ◽

pp. 99-112 ◽

Cited By ~ 1

Author(s):

C. Colliex ◽

C. Jeanguillaume ◽

C. Mory ◽

M. Tencé

Keyword(s):

Electron Microscope ◽

Energy Loss ◽

Field Emission ◽

Transmission Electron Microscope ◽

Spectroscopic Imaging ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Energy Loss

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Observations of Carbon Nanotube Field Emission Failure in the Transmission Electron Microscope

Materials Science Forum - PRICM-5 ◽

10.4028/0-87849-960-1.4071 ◽

2005 ◽

pp. 4071-4076

Author(s):

M.S. Wang ◽

Jan Yong Wang ◽

C.H. Jin ◽

Qing Chen ◽

Lian Mao Peng

Keyword(s):

Electron Microscope ◽

Carbon Nanotube ◽

Field Emission ◽

Transmission Electron Microscope ◽

Transmission Electron

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Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

Microscopy ◽

10.1093/jmicro/dfaa040 ◽

2020 ◽

Vol 69 (6) ◽

pp. 411-416

Author(s):

Tetsuya Akashi ◽

Yoshio Takahashi ◽

Ken Harada

Keyword(s):

Electron Microscope ◽

Single Crystal ◽

Single Crystals ◽

Field Emission ◽

Transmission Electron Microscope ◽

Beam Splitters ◽

Interference Fringes ◽

Transmission Electron ◽

Performance Results

Abstract We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.

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