Device for measuring the integral cross section of elastic scattering of ions on gas target. (USSR)

Vacuum ◽  
1976 ◽  
Vol 26 (12) ◽  
pp. 552
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.


Author(s):  
M. Isaacson

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.


Author(s):  
О. С. Шевченко ◽  
Ю. Н. Ранюк ◽  
А. М. Довбня ◽  
Е. Л. Купленніков

1979 ◽  
Vol 85 (4) ◽  
pp. 458-462 ◽  
Author(s):  
A. Bertin ◽  
I. Massa ◽  
M. Piccinini ◽  
A. Vacchi ◽  
G. Vannini ◽  
...  

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