Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements
2001 ◽
Vol 467-468
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pp. 1541-1544
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1981 ◽
Vol 14
(5)
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pp. 783-788
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2005 ◽
Vol 12
(5)
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pp. 670-674
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1971 ◽
Vol 4
(18)
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pp. L366-L369
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2016 ◽
Vol 72
(2)
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pp. 197-205
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