Dispersion-compensating scanning X-ray spectrometer for Compton profile measurements

Author(s):  
P. Suortti ◽  
T. Buslaps ◽  
M. DiMichiel ◽  
V. Honkimäki ◽  
U. Lienert ◽  
...  
Keyword(s):  
1997 ◽  
Vol 66 (2) ◽  
pp. 318-321 ◽  
Author(s):  
Akihisa Koizumi ◽  
Nobuhiko Sakai ◽  
Nobuya Shirai ◽  
Masami Ando

2006 ◽  
Vol 21 (2) ◽  
pp. 152-155 ◽  
Author(s):  
W. T. Elam ◽  
Bob Shen ◽  
Bruce Scruggs ◽  
Joseph Nicolosi

Rapid and accurate methods are becoming available to calculate all of the relevant physical effects that contribute to an energy-dispersive X-ray fluorescence (EDXRF) spectrum, rather than just the characteristic line intensities given by the traditional fundamental parameters method. To evaluate the utility of such methods, we have calculated the full spectra of several compounds covering a wide range of compositions. The calculated spectra are compared directly with measured spectra. They include scattering of the X-ray tube lines and continuum, the Compton profile, and the detector response. Our results indicate that it is now possible to compute the full spectrum from an EDXRF system with very good accuracy.


1999 ◽  
Vol 32 (2) ◽  
pp. 322-326 ◽  
Author(s):  
Khalid Laaziri ◽  
J. L. Robertson ◽  
S. Roorda ◽  
M. Chicoine ◽  
S. Kycia ◽  
...  

A fitting procedure for separating the inelastic and elastic contributions to the total scattering in diffuse-scattering experiments at high energy using energy-dispersive X-ray techniques is presented. An asymmetric peak function is used to model the elastic peak. The inelastic scattering peak is modeled using a theoretical Compton profile, calculated using the impulse approximation (Hartree–Fock wave functions were used), convoluted with the detector resolution. This procedure, which requires only two free parameters, is shown to be extremely effective in extracting the integrated elastic intensity of coherent scattering at each wave vector, even at low scattering angles where the Compton scattering is not well resolved.


2005 ◽  
Vol 12 (5) ◽  
pp. 670-674 ◽  
Author(s):  
N. Hiraoka ◽  
T. Buslaps ◽  
V. Honkimäki ◽  
P. Suortti
Keyword(s):  

1971 ◽  
Vol 4 (18) ◽  
pp. L366-L369 ◽  
Author(s):  
S Manninen ◽  
O Inkinen ◽  
V Halonen
Keyword(s):  

1989 ◽  
Vol 155 (1) ◽  
pp. 201-207 ◽  
Author(s):  
Yu. V. Aleksandrov ◽  
V. G. Tsirelson ◽  
I. M. Reznik ◽  
R. P. Ozerov

2016 ◽  
Vol 72 (2) ◽  
pp. 197-205 ◽  
Author(s):  
S. P. Collins ◽  
D. Laundy ◽  
T. Connolley ◽  
G. van der Laan ◽  
F. Fabrizi ◽  
...  

This paper discusses the possibility of using Compton scattering – an inelastic X-ray scattering process that yields a projection of the electron momentum density – to probe magnetoelectrical properties. It is shown that an antisymmetric component of the momentum density is a unique fingerprint of such time- and parity-odd physics. It is argued that polar ferromagnets are ideal candidates to demonstrate this phenomenon and the first experimental results are shown, on a single-domain crystal of GaFeO3. The measured antisymmetric Compton profile is very small (≃ 10−5of the symmetric part) and of the same order of magnitude as the statistical errors. Relativistic first-principles simulations of the antisymmetric Compton profile are presented and it is shown that, while the effect is indeed predicted by theory, and scales with the size of the valence spin–orbit interaction, its magnitude is significantly overestimated. The paper outlines some important constraints on the properties of the antisymmetric Compton profile arising from the underlying crystallographic symmetry of the sample.


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