Surface characterization of Al–Cu–Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy
1999 ◽
Vol 147
(1-4)
◽
pp. 140-145
◽
1999 ◽
Vol 143
(1-4)
◽
pp. 169-173
◽
2000 ◽
Vol 194-195
◽
pp. 129-136
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1990 ◽
pp. 1093-1099
◽
1991 ◽
Vol 9
(2)
◽
pp. 775
◽
1998 ◽
Vol 13
(9)
◽
pp. 2389-2395
◽
2003 ◽
Vol 17
(18n20)
◽
pp. 3300-3303
◽