A new technique for membrane characterisation: direct measurement of the force of adhesion of a single particle using an atomic force microscope

1998 ◽  
Vol 139 (2) ◽  
pp. 269-274 ◽  
Author(s):  
W.Richard Bowen ◽  
Nidal Hilal ◽  
Robert W. Lovitt ◽  
Chris J. Wright
Keyword(s):  
Atomic Force Microscope ◽  
Direct Measurement ◽  
Single Particle ◽  
New Technique ◽  
Atomic Force ◽  
A New Technique

Direct Measurement of Interactions between Adsorbed Protein Layers Using an Atomic Force Microscope

1998 ◽  
Vol 197 (2) ◽  
pp. 348-352 ◽  
Author(s):  
W.Richard Bowen ◽  
Nidal Hilal ◽  
Robert W. Lovitt ◽  
Chris J. Wright
Keyword(s):  
Atomic Force Microscope ◽  
Direct Measurement ◽  
Atomic Force ◽  
Adsorbed Protein

A new technique for direct measurement of the shear force necessary to detach a cell from a material

Biomaterials ◽  
1998 ◽  
Vol 19 (7-9) ◽  
pp. 871-879 ◽  
Author(s):  
Akiko Yamamoto ◽  
Shuzo Mishima ◽  
Norio Maruyama ◽  
Masae Sumita
Keyword(s):  
Direct Measurement ◽  
Shear Force ◽  
New Technique ◽  
A Cell ◽  
A New Technique

Experimental and Theoretical Study of the New Image Force Microscopy Principle (Invited Paper)

2011 ◽  
Vol 1318 ◽  
Author(s):  
H. Kumar Wickramasinghe ◽  
Indrajith Rajapaksa
Keyword(s):  
Ultra Violet ◽  
Image Force ◽  
Mirror Image ◽  
New Technique ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
A New Technique ◽  
Mechanical Detection ◽  
Molecular Resonance

ABSTRACTA new technique in microscopy is demonstrated in which the domain of Atomic Force Microscopy (AFM) is extended to optical spectroscopy at the nanometer scale. Molecular resonance of feature sizes down to the single molecular level were detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven object molecular dipole and its mirror image in a Platinum coated scanning probe tip. We provide full experimental details including a basic theory for this new technique. The microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultra violet.

The direct measurement of linewidth using an atomic force microscope

2008 ◽  
Vol 51 (5) ◽  
pp. 470-474
Author(s):  
Yu. A. Novikov ◽  
A. V. Rakov ◽  
P. A. Todua
Keyword(s):  
Atomic Force Microscope ◽  
Direct Measurement ◽  
Atomic Force
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